Measurement of Dielectric Properties at 75 - 325 GHz using a Vector Network Analyzer and Full Wave Simulator

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dc.contributor.authorKhanal, Subash
dc.contributor.authorKiuru, Tero
dc.contributor.authorMallat, Juha
dc.contributor.authorLuukkonen, Olli
dc.contributor.authorRaisanen, Antti V.
dc.coverage.issue2cs
dc.coverage.volume21cs
dc.date.accessioned2015-01-22T11:09:04Zcs_CZ
dc.date.accessioned2015-01-22T14:05:31Z
dc.date.available2015-01-22T11:09:04Zcs_CZ
dc.date.available2015-01-22T14:05:31Z
dc.date.issued2012-06cs
dc.description.abstractThis paper presents a fast and easy to use method to determine permittivity and loss tangent in the frequency range of 75 to 325 GHz. To obtain the permittivity and the loss tangent of the test material, the reflection and transmission S-parameters of a waveguide section filled with the test material are measured using a vector network analyzer and then compared with the simulated plots from a full wave simulator (HFSS), or alternatively the measurement results are used in mathematical formulas. The results are coherent over multiple waveguide bands.en
dc.formattextcs
dc.format.extent551-556cs
dc.format.mimetypeapplication/pdfen
dc.identifier.citationRadioengineering. 2012, vol. 21, č. 2, s. 551-556. ISSN 1210-2512cs
dc.identifier.issn1210-2512cs_CZ
dc.identifier.urihttp://hdl.handle.net/11012/37094cs_CZ
dc.language.isoencs
dc.publisherSpolečnost pro radioelektronické inženýrstvícs
dc.relation.ispartofRadioengineeringcs
dc.relation.urihttp://www.radioeng.cz/fulltexts/2012/12_02_0551_0556.pdfcs
dc.rightsCreative Commons Attribution 3.0 Unported Licenseen
dc.rights.accessopenAccessen
dc.rights.urihttp://creativecommons.org/licenses/by/3.0/en
dc.subjectDielectric constanten
dc.subjectPermittivityen
dc.subjectLoss tangenten
dc.subjectS-parametersen
dc.subjectMaterial measurementen
dc.titleMeasurement of Dielectric Properties at 75 - 325 GHz using a Vector Network Analyzer and Full Wave Simulatoren
dc.type.driverarticleen
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
eprints.affiliatedInstitution.facultyFakulta eletrotechniky a komunikačních technologiícs
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