Measurement of Dielectric Properties at 75 - 325 GHz using a Vector Network Analyzer and Full Wave Simulator
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Date
2012-06
Authors
Khanal, Subash
Kiuru, Tero
Mallat, Juha
Luukkonen, Olli
Raisanen, Antti V.
ORCID
Advisor
Referee
Mark
Journal Title
Journal ISSN
Volume Title
Publisher
Společnost pro radioelektronické inženýrství
Abstract
This paper presents a fast and easy to use method to determine permittivity and loss tangent in the frequency range of 75 to 325 GHz. To obtain the permittivity and the loss tangent of the test material, the reflection and transmission S-parameters of a waveguide section filled with the test material are measured using a vector network analyzer and then compared with the simulated plots from a full wave simulator (HFSS), or alternatively the measurement results are used in mathematical formulas. The results are coherent over multiple waveguide bands.
Description
Citation
Radioengineering. 2012, vol. 21, č. 2, s. 551-556. ISSN 1210-2512
http://www.radioeng.cz/fulltexts/2012/12_02_0551_0556.pdf
http://www.radioeng.cz/fulltexts/2012/12_02_0551_0556.pdf
Document type
Peer-reviewed
Document version
Published version
Date of access to the full text
Language of document
en