Stitching accuracy in large area scanning probe microscopy

Simple item page
dc.contributor.authorKlapetek, Petrcs
dc.contributor.authorNečas, Davidcs
dc.contributor.authorHeaps, Edwardcs
dc.contributor.authorSauvet, Brunocs
dc.contributor.authorKlapetek, Vojtěchcs
dc.contributor.authorValtr, Miroslavcs
dc.contributor.authorKorpelainen, Virpics
dc.contributor.authorYacoot, Andrewcs
dc.coverage.issue12cs
dc.coverage.volume35cs
dc.date.accessioned2025-04-04T11:56:56Z
dc.date.available2025-04-04T11:56:56Z
dc.date.issued2024-10-04cs
dc.description.abstractImage stitching is a technique that can significantly enlarge the scan area of scanning probe microscope (SPM) images. It is also the most commonly used method to cover large areas in high-speed SPM. In this paper, we provide details on stitching algorithms developed specifically to mitigate the effects of SPM error sources, namely the presence of scanner non-flatness. Using both synthetic data and flat samples we analyse the potential uncertainty contributions related to stitching, showing that the drift and line mismatch are the dominant sources of uncertainty. We also present the 'flatten base' algorithm that can significantly improve the stitched data results, at the cost of losing the large area form information about the sample.en
dc.formattextcs
dc.format.extent125026-125037cs
dc.format.mimetypeapplication/pdfcs
dc.identifier.citationMeasurement Science and Technology. 2024, vol. 35, issue 12, p. 125026-125037.en
dc.identifier.doi10.1088/1361-6501/ad7a13cs
dc.identifier.issn1361-6501cs
dc.identifier.orcid0000-0001-5241-9178cs
dc.identifier.orcid0000-0001-7731-8453cs
dc.identifier.orcid0000-0002-7628-9184cs
dc.identifier.other193388cs
dc.identifier.researcheridD-6819-2012cs
dc.identifier.researcheridD-7166-2012cs
dc.identifier.researcheridE-3342-2012cs
dc.identifier.urihttps://hdl.handle.net/11012/250802
dc.language.isoencs
dc.publisherIOP Publishing Ltdcs
dc.relation.ispartofMeasurement Science and Technologycs
dc.relation.urihttps://iopscience.iop.org/article/10.1088/1361-6501/ad7a13cs
dc.rightsCreative Commons Attribution 4.0 Internationalcs
dc.rights.accessopenAccesscs
dc.rights.sherpahttp://www.sherpa.ac.uk/romeo/issn/1361-6501/cs
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/cs
dc.subjectSPMen
dc.subjectstitchingen
dc.subjectuncertaintyen
dc.subjectdata processingen
dc.titleStitching accuracy in large area scanning probe microscopyen
dc.type.driverarticleen
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
sync.item.dbidVAV-193388en
sync.item.dbtypeVAVen
sync.item.insts2025.04.04 13:56:56en
sync.item.modts2025.04.02 15:32:00en
thesis.grantorVysoké učení technické v Brně. Středoevropský technologický institut VUT. Vývoj metod analýzy a měřenícs
thesis.grantorVysoké učení technické v Brně. Středoevropský technologický institut VUT. Plazmové technologie pro materiálycs
Files
Original bundle
Now showing 1 - 1 of 1
Thumbnail Image
Name:
Klapetek_2024.pdf
Size:
3.11 MB
Format:
Adobe Portable Document Format
Description:
file Klapetek_2024.pdf
Download
Collections
Vývoj metod analýzy a měření
Plazmové technologie pro materiály