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Stitching accuracy in large area scanning probe microscopy
(IOP Publishing Ltd, 2024-10-04) Klapetek, Petr; Nečas, David; Heaps, Edward; Sauvet, Bruno; Klapetek, Vojtěch; Valtr, Miroslav; Korpelainen, Virpi; Yacoot, Andrew
Image stitching is a technique that can significantly enlarge the scan area of scanning probe microscope (SPM) images. It is also the most commonly used method to cover large areas in high-speed SPM. In this paper, we provide details on stitching algorithms developed specifically to mitigate the effects of SPM error sources, namely the presence of scanner non-flatness. Using both synthetic data and flat samples we analyse the potential uncertainty contributions related to stitching, showing that the drift and line mismatch are the dominant sources of uncertainty. We also present the 'flatten base' algorithm that can significantly improve the stitched data results, at the cost of losing the large area form information about the sample.
Interplay between multipole expansion of exchange interaction and Coulomb correlation of exciton in colloidal II-VI quantum dots
(IOP Publishing Ltd, 2022-03-01) Klenovský, Petr; Valdhans, Jakub; Krejčí, Lucie; Valtr, Miroslav; Klapetek, Petr; Fedotova, Olga
We study the effect of Coulomb correlation on the emission properties of the ground state exciton in zincblende CdSe/ZnS core-shell and in wurtzite ZnO quantum dots (QDs). We validate our theory model by comparing results of computed exciton energies of CdSe/ZnS QDs to photoluminescence and scanning near-field optical microscopy measurements. We use that to estimate the diameter of the QDs using a simple model based on infinitely deep quantum well and compare the results with the statistics of the atomic force microscopy scans of CdSe/ZnS dots, obtaining excellent agreement. Thereafter, we compute the energy fine structure of exciton, finding striking difference between properties of zincblende CdSe/ZnS and wurtzite ZnO dots. While in the former the fine structure is dominated by the dipole terms of the multipole expansion of the exchange interaction, in the latter system that is mostly influenced by Coulomb correlation. Furthermore, the correlation sizeably influences also the exciton binding energy and emission radiative rate in ZnO dots.
Optical characterization of inhomogeneous thin films with randomly rough boundaries
(Optica Publishing Group, 2022-01-17) Vohánka, Jíří; Ohlídal, Ivan; Buršíková, Vilma; Klapetek, Petr; Kaur, Nupinder Jeet
An inhomogeneous polymer-like thin film was deposited by the plasma enhanced chemical vapor deposition onto silicon single-crystal substrate whose surface was roughened by anodic oxidation. The inhomogeneous thin film with randomly rough boundaries was created as a result. This sample was studied using the variable-angle spectroscopic ellipsometry and spectroscopic reflectometry. The structural model including the inhomogeneous thin film, transition layer, and identically rough boundaries was used to process the experimental data. The scalar diffraction theory was used to describe the influence of roughness. The influence of the scattered light registered by the spectrophotometer due to its finite acceptance angle was also taken into account. The thicknesses and optical constants of the inhomogeneous thin film and the transition layer were determined in the optical characterization together with the roughness parameters. The determined rms value of the heights of roughness was found to be in good agreement with values obtained using AFM. The results of the optical characterization of the studied inhomogeneous thin film with rough boundaries were also verified by comparing them with the results of the optical characterization of the inhomogeneous thin film prepared using the same deposition conditions but onto the substrate with a smooth surface. (C) 2022 Optica Publishing Group under the terms of the Optica Open Access Publishing Agreement
Multiple-fibre interferometry setup for probe sample interaction measurements in atomic force microscopy
(IOP Publishing, 2020-09-01) Klapetek, Petr; Yacoot, Andrew; Hortvík, Václav; Duchoň, Václav; Dongmo, Herve; Řeřucha, Šimon; Valtr, Miroslav; Nečas, David
Atomic force microscopy (AFM) often relies on the assumption that cantilever bending can be described by simple beam theory and that the displacement of the tip can be evaluated from the cantilever angle. Some more advanced metrological instruments use free-space or fibre interferometers for measuring the position of the cantilever apex directly, thereby simplifying the metrology traceability chain. The next logical development, covering measurements of both the cantilever apex position and its deformation due to lateral forces acting during different AFM measurement regimes, is presented in this paper. It is based on using a set of closely packed fibre interferometers that can be used to determine localised bending of the cantilever at different positions along the cantilever. This can be used for detection of cantilever deformation beyond classical beam theory, and can yield both better understanding of sources of uncertainty in individual AFM force-distance measurements and more accurate scanning in constant height mode in high-speed AFM applications.
How levelling and scan line corrections ruin roughness measurement and how to prevent it
(Springer Nature, 2020-09-17) Nečas, David; Valtr, Miroslav; Klapetek, Petr
Surface roughness plays an important role in various fields of nanoscience and nanotechnology. However, the present practices in roughness measurements, typically based on some Atomic Force Microscopy measurements for nanometric roughness or optical or mechanical profilometry for larger scale roughness significantly bias the results. Such biased values are present in nearly all the papers dealing with surface parameters, in the areas of nanotechnology, thin films or material science. Surface roughness, most typically root mean square value of irregularities Sq is often used parameter that is used to control the technologies or to link the surface properties with other material functionality. The error in estimated values depends on the ratio between scan size and roughness correlation length and on the way how the data are processed and can easily be larger than 10% without us noting anything suspicious. Here we present a survey of how large is the problem, detailed analysis of its nature and suggest methods to predict the error in roughness measurements and possibly to correct them. We also present a guidance for choosing suitable scan area during the measurement.

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