Measurement and Simulation of Coaxial to Microstrip Transitions' Radiation Properties and Substrate Influence

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dc.contributor.authorMoravek, Ondrej
dc.contributor.authorHoffmann, Karel
dc.coverage.issue2cs
dc.coverage.volume21cs
dc.date.accessioned2015-01-22T11:09:04Zcs_CZ
dc.date.accessioned2015-01-22T14:16:26Z
dc.date.available2015-01-22T11:09:04Zcs_CZ
dc.date.available2015-01-22T14:16:26Z
dc.date.issued2012-06cs
dc.description.abstractA radiation and electro-magnetic (EM) field analysis of coaxial-to-microstrip transitions is presented. Radiation is quantified by simulation and measurement of a crosstalk between two Omni-Spectra's transitions using microstrip 'open' calibration standards at different positions. Simulation results are compared to the measured data and good agreement is reported on two different substrates. The evaluation method which is used to analyze quality of the transition and its radiation properties was already developed and verified on a grounded coplanar waveguide (CPWG) transmission line. Results can be used to estimate uncertainty budget of the calibrated measurement with respect to the measured radiation. Results on different substrates show interesting behaviour and can prove useful when choosing suitable substrate for specific test-fixture.en
dc.formattextcs
dc.format.extent568-572cs
dc.format.mimetypeapplication/pdfen
dc.identifier.citationRadioengineering. 2012, vol. 21, č. 2, s. 568-572. ISSN 1210-2512cs
dc.identifier.issn1210-2512cs_CZ
dc.identifier.urihttp://hdl.handle.net/11012/37096cs_CZ
dc.language.isoencs
dc.publisherSpolečnost pro radioelektronické inženýrstvícs
dc.relation.ispartofRadioengineeringcs
dc.relation.urihttp://www.radioeng.cz/fulltexts/2012/12_02_0568_0572.pdfcs
dc.rightsCreative Commons Attribution 3.0 Unported Licenseen
dc.rights.accessopenAccessen
dc.rights.urihttp://creativecommons.org/licenses/by/3.0/en
dc.subjectMicrostripen
dc.subjectmeasurement standardsen
dc.subjectmicrowave measurementen
dc.subjectmicrowave propagationen
dc.subjectelectromagnetic fieldsen
dc.subjectradiation effectsen
dc.titleMeasurement and Simulation of Coaxial to Microstrip Transitions' Radiation Properties and Substrate Influenceen
dc.type.driverarticleen
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
eprints.affiliatedInstitution.facultyFakulta eletrotechniky a komunikačních technologiícs
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