Enhanced Coupling Values in Coupled Microstrip Lines using Metamaterials

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dc.contributor.authorLauro, Sebastian E.
dc.contributor.authorToscano, Alessandro
dc.contributor.authorVegni, Lucio
dc.coverage.issue2cs
dc.coverage.volume17cs
dc.date.accessioned2016-03-18T10:36:30Z
dc.date.available2016-03-18T10:36:30Z
dc.date.issued2008-06cs
dc.description.abstractIn this paper, we show how metamaterials can be used to enhance the coupling values of microstrip directional couplers. Coupling between regular coplanar microstrip lines, in fact, is limited, due to the small ratios between the characteristic impedances of even and odd TEM modes supported by the structure. The broadside configuration or the employment of an overlay are often utilized to overcome this limitation, leading, however, to more bulky components. On the other hand, the employment of metamaterials with a negative real part of the permittivity is able to increase the coupling values, while keeping the profile of the structure very low. A quasi-static model of the structure is developed and physical insights on the operation of the proposed component and on the role of the metamaterial loading are also given. Simple design formulae derived through a conformal mapping technique are presented and validated through proper full wave numerical simulations.en
dc.formattextcs
dc.format.extent56-60cs
dc.format.mimetypeapplication/pdfen
dc.identifier.citationRadioengineering. 2008, vol. 17, č. 2, s. 56-60. ISSN 1210-2512cs
dc.identifier.issn1210-2512
dc.identifier.urihttp://hdl.handle.net/11012/57192
dc.language.isoencs
dc.publisherSpolečnost pro radioelektronické inženýrstvícs
dc.relation.ispartofRadioengineeringcs
dc.relation.urihttp://www.radioeng.cz/fulltexts/2008/08_02_056_060.pdfcs
dc.rightsCreative Commons Attribution 3.0 Unported Licenseen
dc.rights.accessopenAccessen
dc.rights.urihttp://creativecommons.org/licenses/by/3.0/en
dc.subjectCoupled linesen
dc.subjectmicrostrip linesen
dc.subjectmetamaterialsen
dc.titleEnhanced Coupling Values in Coupled Microstrip Lines using Metamaterialsen
dc.type.driverarticleen
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
eprints.affiliatedInstitution.facultyFakulta eletrotechniky a komunikačních technologiícs
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