Automatic marker-free estimation methods for the axis of rotation in sub-micron X-ray computed tomography

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dc.contributor.authorZemek, Marekcs
dc.contributor.authorŠalplachta, Jakubcs
dc.contributor.authorZikmund, Tomášcs
dc.contributor.authorOmote, Kazuhikocs
dc.contributor.authorTakeda, Yoshihirocs
dc.contributor.authorOberta, Petercs
dc.contributor.authorKaiser, Jozefcs
dc.coverage.issueMarch 2023cs
dc.coverage.volume1cs
dc.date.issued2023-03-01cs
dc.description.abstractMisalignment of the rotation axis causes severe artifacts in X-ray computed tomography. Calibration of this parameter is often insufficient for sub-micron resolution measurements and needs to be corrected during the post-processing. This correction can be accelerated by various automatic methods. These vary in mechanisms and performance, making them suitable for different use-cases. This work summarizes existing automatic methods for estimating the rotation axis in X-ray computed tomography, with a focus on sub-micron applications. Some of the methods are implemented and compared in the context of a laboratory sub-micron scanner to demonstrate practical considerations of this task.en
dc.formattextcs
dc.format.extent1-17cs
dc.format.mimetypeapplication/pdfcs
dc.identifier.citationTomography of Materials and Structures. 2023, vol. 1, issue March 2023, p. 1-17.en
dc.identifier.doi10.1016/j.tmater.2022.100002cs
dc.identifier.issn2949-673Xcs
dc.identifier.orcid0000-0002-3236-4111cs
dc.identifier.orcid0000-0002-0149-7843cs
dc.identifier.orcid0000-0003-2948-5198cs
dc.identifier.orcid0000-0002-7397-125Xcs
dc.identifier.other180531cs
dc.identifier.researcheridAAT-5323-2021cs
dc.identifier.researcheridR-1104-2018cs
dc.identifier.researcheridG-9491-2014cs
dc.identifier.researcheridD-6800-2012cs
dc.identifier.scopus57221376039cs
dc.identifier.scopus7402184758cs
dc.identifier.urihttp://hdl.handle.net/11012/244321
dc.language.isoencs
dc.publisherElseviercs
dc.relation.ispartofTomography of Materials and Structurescs
dc.relation.urihttps://www.sciencedirect.com/science/article/pii/S2949673X2200002Xcs
dc.rightsCreative Commons Attribution 4.0 Internationalcs
dc.rights.accessopenAccesscs
dc.rights.sherpahttp://www.sherpa.ac.uk/romeo/issn/2949-673X/cs
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/cs
dc.subjectComputed tomographyen
dc.subjectRotation Axisen
dc.subjectTuning-fork artifacten
dc.subjectAutomaticen
dc.titleAutomatic marker-free estimation methods for the axis of rotation in sub-micron X-ray computed tomographyen
dc.type.driverarticleen
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
sync.item.dbidVAV-180531en
sync.item.dbtypeVAVen
sync.item.insts2025.02.03 15:48:23en
sync.item.modts2025.01.17 16:55:55en
thesis.grantorVysoké učení technické v Brně. Fakulta strojního inženýrství. Ústav fyzikálního inženýrstvícs
thesis.grantorVysoké učení technické v Brně. Středoevropský technologický institut VUT. Pokročilé instrumentace a metody pro charakterizace materiálůcs
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Ústav fyzikálního inženýrství
Pokročilé instrumentace a metody pro charakterizace materiálů