Automatic marker-free estimation methods for the axis of rotation in sub-micron X-ray computed tomography

Abstract

Misalignment of the rotation axis causes severe artifacts in X-ray computed tomography. Calibration of this parameter is often insufficient for sub-micron resolution measurements and needs to be corrected during the post-processing. This correction can be accelerated by various automatic methods. These vary in mechanisms and performance, making them suitable for different use-cases. This work summarizes existing automatic methods for estimating the rotation axis in X-ray computed tomography, with a focus on sub-micron applications. Some of the methods are implemented and compared in the context of a laboratory sub-micron scanner to demonstrate practical considerations of this task.Misalignment of the rotation axis causes severe artifacts in X-ray computed tomography. Calibration of this parameter is often insufficient for sub-micron resolution measurements and needs to be corrected during the post-processing. This correction can be accelerated by various automatic methods. These vary in mechanisms and performance, making them suitable for different use-cases. This work summarizes existing automatic methods for estimating the rotation axis in X-ray computed tomography, with a focus on sub-micron applications. Some of the methods are implemented and compared in the context of a laboratory sub-micron scanner to demonstrate practical considerations of this task.