Automatic marker-free estimation methods for the axis of rotation in sub-micron X-ray computed tomography
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Date
2023-03-01
Authors
Zemek, Marek
Šalplachta, Jakub
Zikmund, Tomáš
Omote, Kazuhiko
Takeda, Yoshihiro
Oberta, Peter
Kaiser, Jozef
0000-0002-3236-4111Advisor
Referee
Mark
Journal Title
Journal ISSN
Volume Title
Publisher
Elsevier
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Abstract
Misalignment of the rotation axis causes severe artifacts in X-ray computed tomography. Calibration of this parameter is often insufficient for sub-micron resolution measurements and needs to be corrected during the post-processing. This correction can be accelerated by various automatic methods. These vary in mechanisms and performance, making them suitable for different use-cases. This work summarizes existing automatic methods for estimating the rotation axis in X-ray computed tomography, with a focus on sub-micron applications. Some of the methods are implemented and compared in the context of a laboratory sub-micron scanner to demonstrate practical considerations of this task.
Description
Citation
Tomography of Materials and Structures. 2023, vol. 1, issue March 2023, p. 1-17.
https://www.sciencedirect.com/science/article/pii/S2949673X2200002X
https://www.sciencedirect.com/science/article/pii/S2949673X2200002X
Document type
Peer-reviewed
Document version
Published version
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Language of document
en