Field Ion Microscopy of Tungsten Nano-Tips Coated with Thin Layer of the EpoxyResin
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Date
2024-07-30
Authors
Sobola, Dinara
AL Soud, Ammar
Knápek, Alexandr
Mousa, Marwan
Schubert, Richard
Kočková, Pavla
Škarvada, Pavel
0000-0002-0008-5265Advisor
Referee
Mark
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Preprints.org
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Abstract
This paper reports results of analysis of field ion emission mechanism from tungstenepoxy composite emitters that are compared to tungsten nanofield emitters. In this context, the mechanism of emission from this type of emitters is described based on a theory of induced conductive channels. The tungsten emitters were prepared using the electrochemical polishing technique and coated with a layer of the epoxy resin. Field ion microscope (FIM) analyses are reported including the study of the emissionion density distributions from both the uncoated and coated emitters. Two forms of emission patterns have been observed in the ion emission microscopy technique describing the differences in the emission mechanism of both types of emitters. The observed results show: (a) the expected crystalline surface atomic distribution images of the field ion microscopy in the case of uncoated tungsten tips, and (b) randomly distributed emission spots that describe the locations of the induced conductive channels inside the resin coating layer.
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en