Synthetic Data in Quantitative Scanning Probe Microscopy

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dc.contributor.authorNečas, Davidcs
dc.contributor.authorKlapetek, Petrcs
dc.coverage.issue7cs
dc.coverage.volume11cs
dc.date.issued2021-06-01cs
dc.description.abstractSynthetic data are of increasing importance in nanometrology. They can be used for development of data processing methods, analysis of uncertainties and estimation of various measurement artefacts. In this paper we review methods used for their generation and the applications of synthetic data in scanning probe microscopy, focusing on their principles, performance, and applicability. We illustrate the benefits of using synthetic data on different tasks related to development of better scanning approaches and related to estimation of reliability of data processing methods. We demonstrate how the synthetic data can be used to analyse systematic errors that are common to scanning probe microscopy methods, either related to the measurement principle or to the typical data processing paths.en
dc.formattextcs
dc.format.extent1-26cs
dc.format.mimetypeapplication/pdfcs
dc.identifier.citationNanomaterials. 2021, vol. 11, issue 7, p. 1-26.en
dc.identifier.doi10.3390/nano11071746cs
dc.identifier.issn2079-4991cs
dc.identifier.orcid0000-0001-7731-8453cs
dc.identifier.orcid0000-0001-5241-9178cs
dc.identifier.other173174cs
dc.identifier.researcheridD-7166-2012cs
dc.identifier.researcheridD-6819-2012cs
dc.identifier.urihttp://hdl.handle.net/11012/203015
dc.language.isoencs
dc.publisherMDPIcs
dc.relation.ispartofNanomaterialscs
dc.relation.urihttps://www.mdpi.com/2079-4991/11/7/1746cs
dc.rightsCreative Commons Attribution 4.0 Internationalcs
dc.rights.accessopenAccesscs
dc.rights.sherpahttp://www.sherpa.ac.uk/romeo/issn/2079-4991/cs
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/cs
dc.subjectnanometrologyen
dc.subjectdata synthesisen
dc.subjectscanning probe microscopyen
dc.titleSynthetic Data in Quantitative Scanning Probe Microscopyen
dc.type.driverarticleen
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
sync.item.dbidVAV-173174en
sync.item.dbtypeVAVen
sync.item.insts2025.02.03 15:42:49en
sync.item.modts2025.01.17 18:36:41en
thesis.grantorVysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií. Ústav teoretické a experimentální elektrotechnikycs
thesis.grantorVysoké učení technické v Brně. Středoevropský technologický institut VUT. Vývoj metod analýzy a měřenícs
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