A novel temperature controller for in-situ measurement of radiation-induced changes in temperature effects on space electronics

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dc.contributor.authorHáze, Jiřícs
dc.contributor.authorHofman, Jiřícs
dc.coverage.issue3cs
dc.coverage.volume70cs
dc.date.accessioned2021-07-23T14:55:19Z
dc.date.available2021-07-23T14:55:19Z
dc.date.issued2019-07-15cs
dc.description.abstractThe paper discusses a novel temperature controller and a related test method allowing in-situ measurement of totalionising dose-induced changes in the impact of temperatureon electronic devices for space applications. Various results ofpilot radiation experiments (testing commercial PMOS transistors, RADFETs, and voltage references) are also presented.en
dc.formattextcs
dc.format.extent227-235cs
dc.format.mimetypeapplication/pdfcs
dc.identifier.citationJournal of Electrical Engineering . 2019, vol. 70, issue 3, p. 227-235.en
dc.identifier.doi10.2478/jee-2019-0031cs
dc.identifier.issn1335-3632cs
dc.identifier.other158044cs
dc.identifier.urihttp://hdl.handle.net/11012/200886
dc.language.isoencs
dc.publisherFEI STU Bratislavacs
dc.relation.ispartofJournal of Electrical Engineeringcs
dc.relation.urihttp://iris.elf.stuba.sk/JEEEC/data/pdf/3_119-06.pdfcs
dc.rightsCreative Commons Attribution-NonCommercial-NoDerivatives 4.0 Internationalcs
dc.rights.accessopenAccesscs
dc.rights.sherpahttp://www.sherpa.ac.uk/romeo/issn/1335-3632/cs
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/cs
dc.subjectautomated test equipmenten
dc.subjectthermoelectric cooleren
dc.subjectthermometersen
dc.subjecttest softwareen
dc.subjecttest methodsen
dc.subjecttemperatureeffectsen
dc.subjectRADFETen
dc.subjectTIDen
dc.subjectPMOSen
dc.subjecttemperature coefficientsen
dc.subjectMTCen
dc.titleA novel temperature controller for in-situ measurement of radiation-induced changes in temperature effects on space electronicsen
dc.type.driverarticleen
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
sync.item.dbidVAV-158044en
sync.item.dbtypeVAVen
sync.item.insts2021.07.23 16:55:19en
sync.item.modts2021.07.23 16:14:08en
thesis.grantorVysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií. Ústav mikroelektronikycs
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