Automatic test-bench for SiC power devices using LabVIEW

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dc.contributor.authorLeuchter, Jancs
dc.contributor.authorPham, Ngoc Namcs
dc.contributor.authorNguyen, Huy Hoangcs
dc.coverage.issue2cs
dc.coverage.volume75cs
dc.date.accessioned2024-05-14T11:45:41Z
dc.date.available2024-05-14T11:45:41Z
dc.date.issued2024-04-01cs
dc.description.abstractThis paper is devoted to the improvement existing models of electronics devices, which are used in powers electronics as switching devices, and investigate a LabVIEW-based automatic test-bench for Silicon carbide (SiC) power devices. In recent years, power electronic devices are required to be capable handle with higher voltage, leads to development of new generation of power electronic devices, such as SiC devices. However, using a simulation platform, such as Spice, to diminish the complexity of power electronic design with these new devices is hindered by the lack of precise models. The proposed test-bench enables not only measuring static characteristics of SiC power devices, but also extracting key parameters required by simulations. These extracted parameters are then employed in the existing device model, and the simulation results which are based on the model with original parameters and models with extracted parameters are compared with measured results. The comparison clearly demonstrates that parameters obtained from the proposed test-bench significantly enhance the Spice model.en
dc.formattextcs
dc.format.extent77-85cs
dc.format.mimetypeapplication/pdfcs
dc.identifier.citationJournal of Electrical Engineering. 2024, vol. 75, issue 2, p. 77-85.en
dc.identifier.doi10.2478/jee-2024-0011cs
dc.identifier.issn1339-309Xcs
dc.identifier.orcid0000-0003-2845-703Xcs
dc.identifier.orcid0000-0002-9760-3339cs
dc.identifier.other188486cs
dc.identifier.researcheridA-9164-2010cs
dc.identifier.researcheridIUO-4314-2023cs
dc.identifier.scopus8662619400cs
dc.identifier.scopus57251477900cs
dc.identifier.urihttps://hdl.handle.net/11012/245523
dc.language.isoencs
dc.publisherSLOVAK UNIV TECHNOLOGYcs
dc.relation.ispartofJournal of Electrical Engineeringcs
dc.relation.urihttps://sciendo.com/article/10.2478/jee-2024-0011cs
dc.rightsCreative Commons Attribution-NonCommercial-NoDerivatives 4.0 Internationalcs
dc.rights.accessopenAccesscs
dc.rights.sherpahttp://www.sherpa.ac.uk/romeo/issn/1339-309X/cs
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/cs
dc.subjectpower electronic devicesen
dc.subjectSiCen
dc.subjectLabVIEWen
dc.subjectPSpiceen
dc.subjectSpice modelen
dc.titleAutomatic test-bench for SiC power devices using LabVIEWen
dc.type.driverarticleen
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
sync.item.dbidVAV-188486en
sync.item.dbtypeVAVen
sync.item.insts2024.05.14 13:45:41en
sync.item.modts2024.05.14 13:13:52en
thesis.grantorVysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií. Ústav mikroelektronikycs
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