Reliable Modeling of Ideal Generic Memristors via State-Space Transformation

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dc.contributor.authorBiolek, Dalibor
dc.contributor.authorBiolek, Zdenek
dc.contributor.authorBiolkova, Viera
dc.contributor.authorKolka, Zdenek
dc.coverage.issue2cs
dc.coverage.volume24cs
dc.date.accessioned2015-06-29T11:13:56Z
dc.date.available2015-06-29T11:13:56Z
dc.date.issued2015-06cs
dc.description.abstractThe paper refers to problems of modeling and computer simulation of generic memristors caused by the so-called window functions, namely the stick effect, nonconvergence, and finding fundamentally incorrect solutions. A profoundly different modeling approach is proposed, which is mathematically equivalent to window-based modeling. However, due to its numerical stability, it definitely smoothes the above problems away.en
dc.formattextcs
dc.format.extent393-407cs
dc.format.mimetypeapplication/pdfen
dc.identifier.citationRadioengineering. 2015 vol. 24, č. 2, s. 393-407. ISSN 1210-2512cs
dc.identifier.doi10.13164/re.2015.0393en
dc.identifier.issn1210-2512
dc.identifier.urihttp://hdl.handle.net/11012/41840
dc.language.isoencs
dc.publisherSpolečnost pro radioelektronické inženýrstvícs
dc.relation.ispartofRadioengineeringcs
dc.relation.urihttp://www.radioeng.cz/fulltexts/2015/15_02_0393_0407.pdfcs
dc.rightsCreative Commons Attribution 3.0 Unported Licenseen
dc.rights.accessopenAccessen
dc.rights.urihttp://creativecommons.org/licenses/by/3.0/en
dc.subjectConstitutive relationen
dc.subjectmemductanceen
dc.subjectmemristanceen
dc.subjectmemristoren
dc.titleReliable Modeling of Ideal Generic Memristors via State-Space Transformationen
dc.type.driverarticleen
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
eprints.affiliatedInstitution.facultyFakulta eletrotechniky a komunikačních technologiícs
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