Electrical Analogy to an Atomic Force Microscope
| dc.contributor.author | Kucera, Ondrej | |
| dc.coverage.issue | 1 | cs |
| dc.coverage.volume | 19 | cs |
| dc.date.accessioned | 2016-03-11T09:17:15Z | |
| dc.date.available | 2016-03-11T09:17:15Z | |
| dc.date.issued | 2010-04 | cs |
| dc.description.abstract | Several applications of the atomic force microscopy (AFM), such as measurement of soft samples, manipulation with molecules, etc., require mechanical analysis of the AFM probe behavior. In this article we suggest the electrical circuit analogy to AFM cantilever tip motion. Well developed circuit theories in connection with fairly accessible software for circuit analysis make this alternative method easy to use for a wide community of AFM users. | en |
| dc.format | text | cs |
| dc.format.extent | 168-171 | cs |
| dc.format.mimetype | application/pdf | en |
| dc.identifier.citation | Radioengineering. 2010, vol. 19, č. 1, s. 168-171. ISSN 1210-2512 | cs |
| dc.identifier.issn | 1210-2512 | |
| dc.identifier.uri | http://hdl.handle.net/11012/56979 | |
| dc.language.iso | en | cs |
| dc.publisher | Společnost pro radioelektronické inženýrství | cs |
| dc.relation.ispartof | Radioengineering | cs |
| dc.relation.uri | http://www.radioeng.cz/fulltexts/2010/10_01_168_171.pdf | cs |
| dc.rights | Creative Commons Attribution 3.0 Unported License | en |
| dc.rights.access | openAccess | en |
| dc.rights.uri | http://creativecommons.org/licenses/by/3.0/ | en |
| dc.subject | Atomic Force Microscopy | en |
| dc.subject | electrical mechanical analogs | en |
| dc.subject | circuit theory | en |
| dc.title | Electrical Analogy to an Atomic Force Microscope | en |
| dc.type.driver | article | en |
| dc.type.status | Peer-reviewed | en |
| dc.type.version | publishedVersion | en |
| eprints.affiliatedInstitution.faculty | Fakulta eletrotechniky a komunikačních technologií | cs |
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