A Three-Dimensional DRAM Using Floating Body Capacitance Cells in an FD-SOI Process

dc.contributor.authorLiu, Xuelian
dc.contributor.authorZia, Aamir
dc.coverage.issue4cs
dc.coverage.volume22cs
dc.date.accessioned2015-01-21T14:44:57Z
dc.date.available2015-01-21T14:44:57Z
dc.date.issued2013-12cs
dc.description.abstractThis paper describes a three- dimensional DRAM in which the floating body capacitance (FBC) of a fully depleted SOI (FD-SOI) device is used as a storage node. This 1T DRAM lends itself particularly well to a 3D wafer-to-wafer bonding process because of the absence of deep etched and filled trench capacitor structure, and the improved thickness control tolerance in wafer thinning. A novel three-tier, 3D, 1T embedded DRAM is presented that can be vertically integrated with a microprocessor, achieving low cost, high-density on-chip main memory. A 394Kbits test chip has been designed and fabricated using the Lincoln Labs 3-Tier 3D 0.18um fully depleted SOI CMOS process where an earlier (and previously reported) successful 3D SRAM was obtained. The measured retention time under holding conditions in this 180 nm process is greater than 10 ms. The test chip measures an access time of 50 ns and operates at 10 MHz.en
dc.formattextcs
dc.format.extent975-984cs
dc.format.mimetypeapplication/pdfen
dc.identifier.citationRadioengineering. 2013, vol. 22, č. 4, s. 975-984. issn 1210-2512cs
dc.identifier.issn1210-2512
dc.identifier.urihttp://hdl.handle.net/11012/36950
dc.language.isoencs
dc.publisherSpolečnost pro radioelektronické inženýrstvícs
dc.relation.ispartofRadioengineeringcs
dc.relation.urihttp://www.radioeng.cz/fulltexts/2013/13_04_0975_0984.pdfcs
dc.rightsCreative Commons Attribution 3.0 Unported Licenseen
dc.rights.accessopenAccessen
dc.rights.urihttp://creativecommons.org/licenses/by/3.0/en
dc.subjectCapacitor-less 1T DRAMen
dc.subjectembedded DRAMen
dc.subjectFD-SOIen
dc.subjectfloating body cellen
dc.subjectmemory stacken
dc.subject3-D integrationen
dc.titleA Three-Dimensional DRAM Using Floating Body Capacitance Cells in an FD-SOI Processen
dc.type.driverarticleen
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
eprints.affiliatedInstitution.facultyFakulta eletrotechniky a komunikačních technologiícs
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