Loop-to-Loop Pulsed Electromagnetic Signal Transfer Across a Thin Metal Screen With Drude-Type Dispersive Behavior
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Date
Authors
Štumpf, Martin
Advisor
Referee
Mark
Journal Title
Journal ISSN
Volume Title
Publisher
IEEE Press
ORCID
0000-0002-7477-7694 Altmetrics
Abstract
A full analytic time-domain analysis is presented for a canonical problem of electromagnetic interference related to the operation of integrated-circuit devices at optical frequencies, where metal screens and substrates can no longer be characterized as perfect electrical conductors, but the plasmonic behavior of conduction electrons in the metal has to be taken into account.
A full analytic time-domain analysis is presented for a canonical problem of electromagnetic interference related to the operation of integrated-circuit devices at optical frequencies, where metal screens and substrates can no longer be characterized as perfect electrical conductors, but the plasmonic behavior of conduction electrons in the metal has to be taken into account.
A full analytic time-domain analysis is presented for a canonical problem of electromagnetic interference related to the operation of integrated-circuit devices at optical frequencies, where metal screens and substrates can no longer be characterized as perfect electrical conductors, but the plasmonic behavior of conduction electrons in the metal has to be taken into account.
Description
Keywords
Electromagnetic interference (EMI) , modified Cagniard technique , pulsed electromagnetic (EM) field transfer , shielding , time-domain (TD) analysis. , Electromagnetic interference (EMI) , modified Cagniard technique , pulsed electromagnetic (EM) field transfer , shielding , time-domain (TD) analysis.
Citation
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. 2017, vol. 60, issue 4, p. 1-5.
http://ieeexplore.ieee.org/document/8070371/
http://ieeexplore.ieee.org/document/8070371/
Document type
Peer-reviewed
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Published version
Date of access to the full text
Language of document
en