Hybrid architecture of microcode memory Built-In Self Test

dc.contributor.author	Vykydal, Lukáš
dc.coverage.issue	2	cs
dc.coverage.volume	20	cs
dc.date.accessioned	2023-10-09T07:56:08Z
dc.date.available	2023-10-09T07:56:08Z
dc.date.issued	2018-04-30	cs
dc.description.abstract	March tests are a popular method to test semiconductor memory for defects, but they’re originally designed to only work on bit-oriented memories. For practical use march tests have been extended for use on word-oriented memories. This extension is done by either using multiple test data vectors and their inversions, or by using serial march test. These tests access each data word in memory as a shift register. This paper is proposing a microcode-controlled built-in self test architecture that allows us to use both access methods during a single test.	en
dc.format	text	cs
dc.format.extent	36-41	cs
dc.format.mimetype	application/pdf	en
dc.identifier.citation	Elektrorevue. 2018, vol. 20, č. 2, s. 36-41. ISSN 1213-1539	cs
dc.identifier.issn	1213-1539
dc.identifier.uri	http://hdl.handle.net/11012/214228
dc.language.iso	en	cs
dc.publisher	International Society for Science and Engineering, o.s.	cs
dc.relation.ispartof	Elektrorevue	cs
dc.relation.uri	http://www.elektrorevue.cz/	cs
dc.rights	(C) 2018 Elektrorevue	en
dc.rights.access	openAccess	en
dc.title	Hybrid architecture of microcode memory Built-In Self Test	en
dc.type.driver	article	en
dc.type.status	Peer-reviewed	en
dc.type.version	publishedVersion	en
eprints.affiliatedInstitution.faculty	Fakulta elektrotechniky a komunikačních technologií	cs

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