Extended Transfer Bound Error Analysis for Parametric Channel withContinuous Valued Correlated Random Nuisance Parameter

dc.contributor.authorVcelak, Jan
dc.contributor.authorSykora, Jan
dc.coverage.issue3cs
dc.coverage.volume14cs
dc.date.accessioned2016-04-25T08:10:54Z
dc.date.available2016-04-25T08:10:54Z
dc.date.issued2005-09cs
dc.description.abstractIn this paper, we address the extended use of transfer bound analysis of bit error rate (BER) properties. In conjunction with proper parameter modeling, we offer a method to resolve the problem of transfer bound applicability on a system with random and possibly correlated continuous value nuisance parameters. We introduce a new additional parameter space into the original error space and join them in a product matrix for an extended transfer function evaluation. Example applications with simple trellis code for Rayleigh fading channel and phase synchronization error are investigated to demonstrate the functionality of the proved principle. Computer simulation results are presented for two different codes and various fading scenarios, and comparisons are made among analytical and measured system error performances.en
dc.formattextcs
dc.format.extent8-15cs
dc.format.mimetypeapplication/pdfen
dc.identifier.citationRadioengineering. 2005, vol. 14, č. 3, s. 8-15. ISSN 1210-2512cs
dc.identifier.issn1210-2512
dc.identifier.urihttp://hdl.handle.net/11012/58007
dc.language.isoencs
dc.publisherSpolečnost pro radioelektronické inženýrstvícs
dc.relation.ispartofRadioengineeringcs
dc.relation.urihttp://www.radioeng.cz/fulltexts/2005/05_03_08_15.pdfcs
dc.rightsCreative Commons Attribution 3.0 Unported Licenseen
dc.rights.accessopenAccessen
dc.rights.urihttp://creativecommons.org/licenses/by/3.0/en
dc.subjectBER analysisen
dc.subjectTransfer bounden
dc.subjectChannel nuisance parametersen
dc.subjectMarkov modelsen
dc.titleExtended Transfer Bound Error Analysis for Parametric Channel withContinuous Valued Correlated Random Nuisance Parameteren
dc.type.driverarticleen
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
eprints.affiliatedInstitution.facultyFakulta eletrotechniky a komunikačních technologiícs
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