Experimental Measurement of Nanolayers via Electromagnetic, Near Infrared, and Gamma Radiation

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dc.contributor.authorFiala, Pavelcs
dc.contributor.authorBartušek, Karelcs
dc.contributor.authorDědková, Jarmilacs
dc.contributor.authorKadlec, Radimcs
dc.contributor.authorDohnal, Přemyslcs
dc.coverage.issue4cs
dc.coverage.volume19cs
dc.date.issued2019-07-30cs
dc.description.abstractWe discuss and compare the results obtained from experimental measurements of a two-layer, Ni and TiO2 nanometric structure deposited on siliceous glass. Utilizing previous theoretical models of multilayers or periodic systems and their verifications, the paper focuses on measurement in the NIR, visible, UV, X-ray, and gamma bands of the electromagnetic spectrum; the wavelength of the incident electromagnetic wave is respected. The proposed evaluation comprises a brief description of a Snell's law-based semi-analytic model of electromagnetic wave propagation through a layered material. We also demonstrate the expected anti-reflective and shielding effects in the X-ray and gamma-ray bands, respectively.en
dc.formattextcs
dc.format.extent144-152cs
dc.format.mimetypeapplication/pdfcs
dc.identifier.citationMeasurement Science Review. 2019, vol. 19, issue 4, p. 144-152.en
dc.identifier.doi10.2478/msr-2019-0020cs
dc.identifier.issn1335-8871cs
dc.identifier.orcid0000-0002-7203-9903cs
dc.identifier.orcid0000-0002-6598-5424cs
dc.identifier.orcid0000-0002-7919-0489cs
dc.identifier.orcid0009-0009-0892-1078cs
dc.identifier.orcid0000-0003-1163-4458cs
dc.identifier.other161036cs
dc.identifier.researcheridF-7778-2018cs
dc.identifier.researcheridD-3389-2012cs
dc.identifier.researcheridJ-8500-2018cs
dc.identifier.researcheridAAE-2611-2021cs
dc.identifier.scopus15049262200cs
dc.identifier.scopus6508372019cs
dc.identifier.scopus37063206800cs
dc.identifier.scopus37062829400cs
dc.identifier.urihttp://hdl.handle.net/11012/200888
dc.language.isoencs
dc.publisherhttps://content.sciendo.com/configurable/contentpage/journals$002fmsr$002f19$002f4$002farticle-p144.xmlcs
dc.relation.ispartofMeasurement Science Reviewcs
dc.relation.urihttp://www.degruyter.com/view/j/msr.2019.19.issue-4/msr-2019-0020/msr-2019-0020.xml?format=INTcs
dc.rightsCreative Commons Attribution-NonCommercial-NoDerivatives 3.0 Unportedcs
dc.rights.accessopenAccesscs
dc.rights.sherpahttp://www.sherpa.ac.uk/romeo/issn/1335-8871/cs
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/cs
dc.subjectNanomaterialsen
dc.subjectmultilayered materialen
dc.subjectresonanceen
dc.subjectperiodic systemen
dc.subjectelectromagnetic waveen
dc.subjectX-rayen
dc.subjectgamma-rayen
dc.subjectantireflectionen
dc.subjectshieldingen
dc.titleExperimental Measurement of Nanolayers via Electromagnetic, Near Infrared, and Gamma Radiationen
dc.type.driverarticleen
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
sync.item.dbidVAV-161036en
sync.item.dbtypeVAVen
sync.item.insts2025.02.03 15:42:48en
sync.item.modts2025.01.17 16:48:46en
thesis.grantorVysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií. Ústav teoretické a experimentální elektrotechnikycs
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