The LFSR and BCA VHDL Models for Built-in Self-test Circuits

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dc.contributor.authorMitrych, J.
dc.coverage.issue1cs
dc.coverage.volume11cs
dc.date.accessioned2016-04-28T11:56:49Z
dc.date.available2016-04-28T11:56:49Z
dc.date.issued2002-04cs
dc.description.abstractThe various test structures are proposed for BIST techniques [1], [2]. A typical structure used for generation of pseudo-random test sets is the linear feedback shift register (LFSR). The BIST techniques have wide application in testing whole devices and embedded components. We focus on the analysis of the state coverage, fault coverage, and optimal structure of BIST schemes.en
dc.formattextcs
dc.format.extent14-17cs
dc.format.mimetypeapplication/pdfen
dc.identifier.citationRadioengineering. 2002, vol. 11, č. 1, s. 14-17. ISSN 1210-2512cs
dc.identifier.issn1210-2512
dc.identifier.urihttp://hdl.handle.net/11012/58136
dc.language.isoencs
dc.publisherSpolečnost pro radioelektronické inženýrstvícs
dc.relation.ispartofRadioengineeringcs
dc.relation.urihttp://www.radioeng.cz/fulltexts/2002/02_01_14_17.pdfcs
dc.rightsCreative Commons Attribution 3.0 Unported Licenseen
dc.rights.accessopenAccessen
dc.rights.urihttp://creativecommons.org/licenses/by/3.0/en
dc.subjectLinear feedback shift register (LFSR)en
dc.subjectcellular auto-mata (CA)en
dc.subjectmiddle grain FPGA structureen
dc.subjectVHDL modellingen
dc.subjectBIST structure optimal implementationen
dc.titleThe LFSR and BCA VHDL Models for Built-in Self-test Circuitsen
dc.type.driverarticleen
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
eprints.affiliatedInstitution.facultyFakulta eletrotechniky a komunikačních technologiícs
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