An EMI susceptibility study of different integrated operational transconductance amplifiers

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dc.contributor.authorKrolák, Davidcs
dc.contributor.authorHorský, Pavelcs
dc.coverage.issue1cs
dc.coverage.volume74cs
dc.date.accessioned2023-03-10T07:52:40Z
dc.date.available2023-03-10T07:52:40Z
dc.date.issued2023-03-07cs
dc.description.abstractThis paper presents a comparative EMI susceptibility study of different integrated operational transconductance amplifier (OTA) topologies. We analyzed conventional well-known amplifier topologies based on the Miller OTA and folded cascode concepts with lower power consumption. The output dc voltage shifts induced by power supply and input common mode high frequency disturbances are presented. On top of the EMI susceptibility comparison, we discuss PSRR and CMRR within large and small excitation signal with a new simulation setup. Even more, the back-gate connections of differential MOS pair in OTA input stage are investigated for EMI susceptibility impact as well.en
dc.formattextcs
dc.format.extent13-22cs
dc.format.mimetypeapplication/pdfcs
dc.identifier.citationJournal of Electrical Engineering. 2023, vol. 74, issue 1, p. 13-22.en
dc.identifier.doi10.2478/jee-2023-0002cs
dc.identifier.issn1339-309Xcs
dc.identifier.other177756cs
dc.identifier.urihttp://hdl.handle.net/11012/209185
dc.language.isoencs
dc.publisherJournal of Electrical Engineeringcs
dc.relation.ispartofJournal of Electrical Engineeringcs
dc.relation.urihttp://iris.elf.stuba.sk/JEEEC/data/pdf/1_123-02.pdfcs
dc.rightsCreative Commons Attribution-NonCommercial-NoDerivatives 4.0 Internationalcs
dc.rights.accessopenAccesscs
dc.rights.sherpahttp://www.sherpa.ac.uk/romeo/issn/1339-309X/cs
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/cs
dc.subjectCMRRen
dc.subjectcommon modeen
dc.subjectdc voltage shiften
dc.subjectEMCen
dc.subjectEMIen
dc.subjectfolded cascodeen
dc.subjectHF immunityen
dc.subjectlow poweren
dc.subjectMilleren
dc.subjectoperational transconductance amplifieren
dc.subjectOTAen
dc.subjectopen loop gainen
dc.subjectPSRRen
dc.titleAn EMI susceptibility study of different integrated operational transconductance amplifiersen
dc.type.driverarticleen
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
sync.item.dbidVAV-177756en
sync.item.dbtypeVAVen
sync.item.insts2023.05.08 12:52:39en
sync.item.modts2023.05.08 12:14:29en
thesis.grantorVysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií. Ústav radioelektronikycs
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