Noise in piezoelectric ceramics at the low temperatures
dc.contributor.author | Sedlak, Petr | |
dc.contributor.author | Majzner, Jiri | |
dc.contributor.author | Sikula, Josef | |
dc.coverage.issue | 1 | cs |
dc.coverage.volume | 20 | cs |
dc.date.accessioned | 2016-02-26T08:17:27Z | |
dc.date.available | 2016-02-26T08:17:27Z | |
dc.date.issued | 2011-04 | cs |
dc.description.abstract | The piezoelectric ceramic belongs to materials with widespread spectrum of applications. It can be found in sensors as well as in ceramic capacitors. The main sources of voltage or current fluctuation in piezoelectric ceramics are thermal noise, polarization noise and low frequency 1/f noise. The observed spectra of fluctuating voltage or current can be very well described by the generalized Nyquist relation for linear dissipative system. In this work, we focused on validity of the Nyquist relation for piezoelectric ceramics in temperatures 150 K-270 K. The electrical impedance and noise spectral density are measured and compared in frequency range 100 kHz - 1 MHz. The measurements were made in thermal stable condition and under equilibrium conditions in the case of noise measurement. | en |
dc.format | text | cs |
dc.format.extent | 200-203 | cs |
dc.format.mimetype | application/pdf | en |
dc.identifier.citation | Radioengineering. 2011, vol. 20, č. 1, s. 200-203. ISSN 1210-2512 | cs |
dc.identifier.issn | 1210-2512 | |
dc.identifier.uri | http://hdl.handle.net/11012/56818 | |
dc.language.iso | en | cs |
dc.publisher | Společnost pro radioelektronické inženýrství | cs |
dc.relation.ispartof | Radioengineering | cs |
dc.relation.uri | http://www.radioeng.cz/fulltexts/2011/11_01_200_203.pdf | cs |
dc.rights | Creative Commons Attribution 3.0 Unported License | en |
dc.rights.access | openAccess | en |
dc.rights.uri | http://creativecommons.org/licenses/by/3.0/ | en |
dc.subject | Piezoelectric ceramics | en |
dc.subject | thermal noise | en |
dc.subject | 1/f noise | en |
dc.title | Noise in piezoelectric ceramics at the low temperatures | en |
dc.type.driver | article | en |
dc.type.status | Peer-reviewed | en |
dc.type.version | publishedVersion | en |
eprints.affiliatedInstitution.faculty | Fakulta eletrotechniky a komunikačních technologií | cs |
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