Lithographic thin–film structures based on Electrochromic materials: Case study by scanning probe microscopy

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but.event.date26.04.2022cs
but.event.titleSTUDENT EEICT 2022cs
dc.contributor.authorMisiurev, Denis
dc.date.accessioned2023-04-25T10:17:10Z
dc.date.available2023-04-25T10:17:10Z
dc.date.issued2022cs
dc.description.abstractThe main object of this study will be based on producing and characterization of lithographic thin–film structures produced based electrochromic materials. Atomic force microscopy will be used as a main method of evaluation the morphology of lithographic structures. The optical properties of eslectrochromic materials will be analyze using scanning near–field optical microscopy by applying different electrical potential.en
dc.formattextcs
dc.format.extent409-414cs
dc.format.mimetypeapplication/pdfen
dc.identifier.citationProceedings I of the 28st Conference STUDENT EEICT 2022: General papers. s. 409-414. ISBN 978-80-214-6029-4cs
dc.identifier.isbn978-80-214-6029-4
dc.identifier.urihttp://hdl.handle.net/11012/209375
dc.language.isoencs
dc.publisherVysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.relation.ispartofProceedings I of the 28st Conference STUDENT EEICT 2022: General papersen
dc.relation.urihttps://conf.feec.vutbr.cz/eeict/index/pages/view/ke_stazenics
dc.rights© Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.rights.accessopenAccessen
dc.subjectAFMen
dc.subjectSNOMen
dc.subjectelectrochromic materialsen
dc.subjectthin–filmsen
dc.titleLithographic thin–film structures based on Electrochromic materials: Case study by scanning probe microscopyen
dc.type.driverconferenceObjecten
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
eprints.affiliatedInstitution.departmentFakulta elektrotechniky a komunikačních technologiícs
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