Tracking Resistance Of Various Materials In Vacuum
but.event.date | 26.04.2018 | cs |
but.event.title | Student EEICT 2018 | cs |
dc.contributor.author | Šedivý, Matúš | |
dc.date.accessioned | 2019-03-04T10:06:00Z | |
dc.date.available | 2019-03-04T10:06:00Z | |
dc.date.issued | 2018 | cs |
dc.description.abstract | Many vacuum instruments used in industry and scientific research apply high voltage components. Vacuum performs as an insulator with theoretically infinite breakdown voltage. Surface of dielectrics between two electrodes inside a vacuum chamber is the weakest link for a possible electrical breakdown (tracking). This paper focuses on examination of a vacuum pressure influence to the surface breakdown voltage of a various materials. Results were compared and led to determination of an appropriate materials for a design of internal connectors in electron microscopes produced by the company Thermo Fisher Scientific. | en |
dc.format | text | cs |
dc.format.extent | 579-583 | cs |
dc.format.mimetype | application/pdf | en |
dc.identifier.citation | Proceedings of the 24th Conference STUDENT EEICT 2018. s. 579-583. ISBN 978-80-214-5614-3 | cs |
dc.identifier.isbn | 978-80-214-5614-3 | |
dc.identifier.uri | http://hdl.handle.net/11012/138300 | |
dc.language.iso | en | cs |
dc.publisher | Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií | cs |
dc.relation.ispartof | Proceedings of the 24th Conference STUDENT EEICT 2018 | en |
dc.relation.uri | http://www.feec.vutbr.cz/EEICT/ | cs |
dc.rights | © Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií | cs |
dc.rights.access | openAccess | en |
dc.subject | high-voltage | en |
dc.subject | breakdown | en |
dc.subject | tracking | en |
dc.subject | dielectric | en |
dc.subject | glass | en |
dc.subject | Kapton | en |
dc.subject | alumina | en |
dc.subject | PVDF | en |
dc.subject | PEEK | en |
dc.title | Tracking Resistance Of Various Materials In Vacuum | en |
dc.type.driver | conferenceObject | en |
dc.type.status | Peer-reviewed | en |
dc.type.version | publishedVersion | en |
eprints.affiliatedInstitution.department | Fakulta elektrotechniky a komunikačních technologií | cs |
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