A Simple Calorimetric Measurement of SiC MOSFET Switching Loss and Comparison with Electric Measurement

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but.event.date26.04.2022cs
but.event.titleSTUDENT EEICT 2022cs
dc.contributor.authorMikláš, Jan
dc.contributor.authorProcházka, Petr
dc.date.accessioned2022-12-06T13:21:59Z
dc.date.available2022-12-06T13:21:59Z
dc.date.issued2022cs
dc.description.abstractThis paper proposes a simple and accessible method for dynamic calorimetric measurement of ultra-fast power semiconductor devices switching loss. It utilizes a temperature rise monitoring of a copper cube thermally coupled with a semiconductor chip. No special chambers or heat exchangers are used and no additional wiring compared to standard electric pulsed test. This provides an opportunity to perform a direct comparison with traditional electric power loss measurement, including all of the parasitic influences and further investigation of power loss with intentionally varying of particular elements impact, which absent in available literature. The paper establishes the test method and setup as well as a basic comparison of calorimetric and electric measurement.en
dc.formattextcs
dc.format.extent198-203cs
dc.format.mimetypeapplication/pdfen
dc.identifier.citationProceedings II of the 28st Conference STUDENT EEICT 2022: Selected papers. s. 198-203. ISBN 978-80-214-6030-0cs
dc.identifier.doi10.13164/eeict.2022.198
dc.identifier.isbn978-80-214-6030-0
dc.identifier.urihttp://hdl.handle.net/11012/208636
dc.language.isoencs
dc.publisherVysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.relation.ispartofProceedings II of the 28st Conference STUDENT EEICT 2022: Selected papersen
dc.relation.urihttps://conf.feec.vutbr.cz/eeict/index/pages/view/ke_stazenics
dc.rights© Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.rights.accessopenAccessen
dc.subjectPower Semiconductor SiC MOSFET Switching Loss, Parasitic Waveform Distortion, Calorimetric Power Loss Measurement, Electrical Measurement, Double Pulse Test, Measurement Methods Comparisonen
dc.titleA Simple Calorimetric Measurement of SiC MOSFET Switching Loss and Comparison with Electric Measurementen
dc.type.driverconferenceObjecten
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
eprints.affiliatedInstitution.departmentFakulta elektrotechniky a komunikačních technologiícs
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