A Simple Calorimetric Measurement of SiC MOSFET Switching Loss and Comparison with Electric Measurement
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Date
2022
Authors
Mikláš, Jan
Procházka, Petr
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Referee
Mark
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Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií
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Abstract
This paper proposes a simple and accessible method for dynamic calorimetric measurement of ultra-fast power semiconductor devices switching loss. It utilizes a temperature rise monitoring of a copper cube thermally coupled with a semiconductor chip. No special chambers or heat exchangers are used and no additional wiring compared to standard electric pulsed test. This provides an opportunity to perform a direct comparison with traditional electric power loss measurement, including all of the parasitic influences and further investigation of power loss with intentionally varying of particular elements impact, which absent in available literature. The paper establishes the test method and setup as well as a basic comparison of calorimetric and electric measurement.
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Proceedings II of the 28st Conference STUDENT EEICT 2022: Selected papers. s. 198-203. ISBN 978-80-214-6030-0
https://conf.feec.vutbr.cz/eeict/index/pages/view/ke_stazeni
https://conf.feec.vutbr.cz/eeict/index/pages/view/ke_stazeni
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Peer-reviewed
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en
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© Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií