A new approach to measuring the temperature fields in reflow ovens

dc.contributor.authorHurban, Milancs
dc.contributor.authorSzendiuch, Ivancs
dc.coverage.issue2cs
dc.coverage.volume76cs
dc.date.issued2025-04-10cs
dc.description.abstractElectronics play an increasingly significant role in our lives. Consequently, the demand for both production volume and quality in electronics is continuously rising. Conveyor reflow ovens are the most widely used technology for soldering electronic assemblies onto printed circuit boards. The implementation of these ovens directly affects the quality of solder joints and, most importantly, the reliability of manufactured electronic assemblies, which are present in virtually all aspects of daily life. The solder joint is formed by the reflow of the solder alloy and is defined by the thermal profile, which represents temperature over time. The most common heating method relies on forced hot air convection, where the printed circuit board with mounted components moves through the oven. One of the key design requirements for these ovens is maintaining a consistent hermal profile to achieve a homogeneous temperature field across the reflow zones. To assess this condition, it is essential to measure convection under operating conditions. A new method for measuring the temperature field directly within the conveyor oven has been developed and experimentally verified during production.en
dc.description.abstractElectronics play an increasingly significant role in our lives. Consequently, the demand for both production volume and quality in electronics is continuously rising. Conveyor reflow ovens are the most widely used technology for soldering electronic assemblies onto printed circuit boards. The implementation of these ovens directly affects the quality of solder joints and, most importantly, the reliability of manufactured electronic assemblies, which are present in virtually all aspects of daily life. The solder joint is formed by the reflow of the solder alloy and is defined by the thermal profile, which represents temperature over time. The most common heating method relies on forced hot air convection, where the printed circuit board with mounted components moves through the oven. One of the key design requirements for these ovens is maintaining a consistent hermal profile to achieve a homogeneous temperature field across the reflow zones. To assess this condition, it is essential to measure convection under operating conditions. A new method for measuring the temperature field directly within the conveyor oven has been developed and experimentally verified during production.en
dc.formattextcs
dc.format.extent184-189cs
dc.format.mimetypeapplication/pdfcs
dc.identifier.citationJournal of Electrical Engineering-Elektrotechnicky Casopis. 2025, vol. 76, issue 2, p. 184-189.en
dc.identifier.doi10.2478/jee-2025-0019cs
dc.identifier.issn1335-3632cs
dc.identifier.orcid0000-0002-1738-7817cs
dc.identifier.other197663cs
dc.identifier.scopus7801465114cs
dc.identifier.urihttp://hdl.handle.net/11012/251059
dc.language.isoencs
dc.publisherSciendocs
dc.relation.ispartofJournal of Electrical Engineering-Elektrotechnicky Casopiscs
dc.relation.urihttps://sciendo.com/article/10.2478/jee-2025-0019cs
dc.rightsCreative Commons Attribution-NonCommercial-NoDerivatives 4.0 Internationalcs
dc.rights.accessopenAccesscs
dc.rights.sherpahttp://www.sherpa.ac.uk/romeo/issn/1335-3632/cs
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/cs
dc.subjectreflow soldering processen
dc.subjectheat transfer coefficienten
dc.subjectgas flow velocityen
dc.subjectReynolds numberen
dc.subjecttemperature fielden
dc.subjectreflow soldering process
dc.subjectheat transfer coefficient
dc.subjectgas flow velocity
dc.subjectReynolds number
dc.subjecttemperature field
dc.titleA new approach to measuring the temperature fields in reflow ovensen
dc.title.alternativeA new approach to measuring the temperature fields in reflow ovensen
dc.type.driverarticleen
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
sync.item.dbidVAV-197663en
sync.item.dbtypeVAVen
sync.item.insts2025.10.14 14:11:01en
sync.item.modts2025.10.14 09:34:03en
thesis.grantorVysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií. Ústav mikroelektronikycs

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