An enhanced theoretical approach for accurate measurements of the optical and energy characteristics of semiconducting materials

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but.event.date23.04.2024cs
but.event.titleSTUDENT EEICT 2024cs
dc.contributor.authorAllaham, Mohammad M.
dc.contributor.authorKošelová, Zuzana
dc.contributor.authorSobola, Dinara
dc.contributor.authorFohlerová, Zdenka
dc.contributor.authorKnápek, Alexandr
dc.date.accessioned2024-07-09T07:47:50Z
dc.date.available2024-07-09T07:47:50Z
dc.date.issued2024cs
dc.description.abstractThe absorption coefficient is an important optical property in characterizing semiconducting materials. It plays a significant role in studying optical characteristics, electrical structure, energy band structure, and the creation/annihilation of excitons when a semiconducting material absorbs electromagnetic radiation. In this study, an enhanced theoretical model will be introduced and applied to characterize thin films prepared from UPR4 (unsaturated polyester resin) single-component epoxy resin, which is important to study the charge flow at the interface of tungsten-UPR4 composite field emission cathodes.en
dc.formattextcs
dc.format.extent182-186cs
dc.format.mimetypeapplication/pdfen
dc.identifier.citationProceedings II of the 30st Conference STUDENT EEICT 2024: Selected papers. s. 182-186. ISBN 978-80-214-6230-4cs
dc.identifier.doi10.13164/eeict.2024.182
dc.identifier.isbn978-80-214-6230-4
dc.identifier.issn2788-1334
dc.identifier.urihttps://hdl.handle.net/11012/249311
dc.language.isoencs
dc.publisherVysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.relation.ispartofProceedings II of the 30st Conference STUDENT EEICT 2024: Selected papersen
dc.relation.urihttps://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2024_sbornik_2.pdfcs
dc.rights© Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.rights.accessopenAccessen
dc.subjectabsorption coefficienten
dc.subjectenergy gapen
dc.subjectUrbach tailing energyen
dc.subjectTauc ploten
dc.subjecttransmittanceen
dc.subjectand reflectanceen
dc.titleAn enhanced theoretical approach for accurate measurements of the optical and energy characteristics of semiconducting materialsen
dc.type.driverconferenceObjecten
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
eprints.affiliatedInstitution.departmentFakulta elektrotechniky a komunikačních technologiícs
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