An enhanced theoretical approach for accurate measurements of the optical and energy characteristics of semiconducting materials
Loading...
Date
2024
Authors
Allaham, Mohammad M.
Košelová, Zuzana
Sobola, Dinara
Fohlerová, Zdenka
Knápek, Alexandr
ORCID
Advisor
Referee
Mark
Journal Title
Journal ISSN
Volume Title
Publisher
Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií
Altmetrics
Abstract
The absorption coefficient is an important optical property in characterizing semiconducting materials. It plays a significant role in studying optical characteristics, electrical structure, energy band structure, and the creation/annihilation of excitons when a semiconducting material absorbs electromagnetic radiation. In this study, an enhanced theoretical model will be introduced and applied to characterize thin films prepared from UPR4 (unsaturated polyester resin) single-component epoxy resin, which is important to study the charge flow at the interface of tungsten-UPR4 composite field emission cathodes.
Description
Citation
Proceedings II of the 30st Conference STUDENT EEICT 2024: Selected papers. s. 182-186. ISBN 978-80-214-6230-4
https://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2024_sbornik_2.pdf
https://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2024_sbornik_2.pdf
Document type
Peer-reviewed
Document version
Published version
Date of access to the full text
Language of document
en
Study field
Comittee
Date of acceptance
Defence
Result of defence
Document licence
© Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií