Testing of PLL-based True Random Number Generator in Changing Working Conditions

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dc.contributor.authorSimka, Martin
dc.contributor.authorDrutarovsky, Milos
dc.contributor.authorFischer, Viktor
dc.coverage.issue1cs
dc.coverage.volume20cs
dc.date.accessioned2016-02-26T08:17:25Z
dc.date.available2016-02-26T08:17:25Z
dc.date.issued2011-04cs
dc.description.abstractSecurity of cryptographic systems depends significantly on security of secret keys. Unpredictability of the keys is achieved by their generation by True Random Number Generators (TRNGs). In the paper we analyze behavior of the Phase-Locked Loop (PLL) based TRNG in changing working environment. The frequency of signals synthesized by PLL may be naturally influenced by chip temperature. We show what impact the temperature has on the quality of generated random sequence of the PLL-based TRNG. Thank to analysis of internal signals of the generator we are able to prove dependencies between the PLL parameters, statistical parameters of the generated sequence and temperature. Considering the measured results of experiments we form a new requirement in order to improve the robustness of the designed TRNG.en
dc.formattextcs
dc.format.extent94-101cs
dc.format.mimetypeapplication/pdfen
dc.identifier.citationRadioengineering. 2011, vol. 20, č. 1, s. 94-101. ISSN 1210-2512cs
dc.identifier.issn1210-2512
dc.identifier.urihttp://hdl.handle.net/11012/56803
dc.language.isoencs
dc.publisherSpolečnost pro radioelektronické inženýrstvícs
dc.relation.ispartofRadioengineeringcs
dc.relation.urihttp://www.radioeng.cz/fulltexts/2011/11_01_094_101.pdfcs
dc.rightsCreative Commons Attribution 3.0 Unported Licenseen
dc.rights.accessopenAccessen
dc.rights.urihttp://creativecommons.org/licenses/by/3.0/en
dc.subjectTRNGen
dc.subjectphase-locked loopen
dc.subjectcryptographic attacksen
dc.subjecttracking jitteren
dc.subjecton-line randomness testsen
dc.subjectFIPS 140-2en
dc.titleTesting of PLL-based True Random Number Generator in Changing Working Conditionsen
dc.type.driverarticleen
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
eprints.affiliatedInstitution.facultyFakulta eletrotechniky a komunikačních technologiícs
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