The Effect Of Pid On Photovoltaic Cells
but.event.date | 26.04.2018 | cs |
but.event.title | Student EEICT 2018 | cs |
dc.contributor.author | Strachala, Dávid | |
dc.contributor.author | Hylský, Josef | |
dc.date.accessioned | 2019-03-04T10:05:58Z | |
dc.date.available | 2019-03-04T10:05:58Z | |
dc.date.issued | 2018 | cs |
dc.description.abstract | This work deals with the Potential-Induced Degradation (PID) of the silicon photovoltaic modules and cells (PID shortly). The cause of PID degradation is in a migration of positive sodium ions from the protective glass, which was confirmed by the electroluminiscence measurements. The sodium drifts was locally supported by the increasing of the PV module temperature up to 80 °C. Based on the observation, a modification of the photovoltaic structure was added. The new solar cells shows good resisitive properties against PID. | en |
dc.format | text | cs |
dc.format.extent | 534-538 | cs |
dc.format.mimetype | application/pdf | en |
dc.identifier.citation | Proceedings of the 24th Conference STUDENT EEICT 2018. s. 534-538. ISBN 978-80-214-5614-3 | cs |
dc.identifier.isbn | 978-80-214-5614-3 | |
dc.identifier.uri | http://hdl.handle.net/11012/138291 | |
dc.language.iso | en | cs |
dc.publisher | Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií | cs |
dc.relation.ispartof | Proceedings of the 24th Conference STUDENT EEICT 2018 | en |
dc.relation.uri | http://www.feec.vutbr.cz/EEICT/ | cs |
dc.rights | © Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií | cs |
dc.rights.access | openAccess | en |
dc.subject | Potential-Induced Degradation | en |
dc.subject | PV modules | en |
dc.subject | Photovoltaic cells | en |
dc.title | The Effect Of Pid On Photovoltaic Cells | en |
dc.type.driver | conferenceObject | en |
dc.type.status | Peer-reviewed | en |
dc.type.version | publishedVersion | en |
eprints.affiliatedInstitution.department | Fakulta elektrotechniky a komunikačních technologií | cs |
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