Surface morphology and X-ray photoelectron spectroscopy of BiFeO3 thin films deposited on top of Ta2O5/Si layers

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dc.contributor.authorRamazanov, Shikhgasancs
dc.contributor.authorŢălu, Ştefancs
dc.contributor.authorDallaev, Rashidcs
dc.contributor.authorRamazanov, Gusejncs
dc.contributor.authorŠkarvada, Pavelcs
dc.contributor.authorOulehla, Jindřichcs
dc.contributor.authorSobola, Dinaracs
dc.contributor.authorNazarov, Dmitrycs
dc.coverage.issue1cs
dc.coverage.volume295cs
dc.date.issued2021-07-26cs
dc.description.abstractIn this study a comparison of the topography of BiFeO3 (BFO) thin films deposited on tantalum pentoxide substrates of different thicknesses is provided. The Ta2O5 substrates had a roughness increasing with the film thickness. The relationship between substrates of different topography but the same composition with the quality of the growing bismuth ferrite film is estimated. For the first time the topography estimation of BFO on Ta2O5 is presented. The difference in temperature expansion coefficients leads to intensive evaporation of bismuth ferrite from the surface during annealing. XPS analysis is provided for asdeposited and annealed BFO layers.en
dc.formattextcs
dc.format.extent1-7cs
dc.format.mimetypeapplication/pdfcs
dc.identifier.citationE3S Web of Conferences. 2021, vol. 295, issue 1, p. 1-7.en
dc.identifier.doi10.1051/e3sconf/202129504009cs
dc.identifier.issn2267-1242cs
dc.identifier.orcid0000-0002-6823-5725cs
dc.identifier.orcid0000-0002-8059-7761cs
dc.identifier.orcid0000-0002-0008-5265cs
dc.identifier.other172164cs
dc.identifier.researcheridAAE-8648-2020cs
dc.identifier.researcheridG-1175-2019cs
dc.identifier.scopus57201461813cs
dc.identifier.scopus57189064262cs
dc.identifier.urihttp://hdl.handle.net/11012/203039
dc.language.isoencs
dc.publisherEDP Sciencescs
dc.relation.ispartofE3S Web of Conferencescs
dc.relation.urihttps://www.e3s-conferences.org/articles/e3sconf/abs/2021/71/e3sconf_wfsdi2021_04009/e3sconf_wfsdi2021_04009.htmlcs
dc.rightsCreative Commons Attribution 4.0 Internationalcs
dc.rights.accessopenAccesscs
dc.rights.sherpahttp://www.sherpa.ac.uk/romeo/issn/2267-1242/cs
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/cs
dc.subjectbismuth ferriteen
dc.subjecttantalum pentoxideen
dc.subjectspectroscopyen
dc.titleSurface morphology and X-ray photoelectron spectroscopy of BiFeO3 thin films deposited on top of Ta2O5/Si layersen
dc.type.driverconferenceObjecten
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
sync.item.dbidVAV-172164en
sync.item.dbtypeVAVen
sync.item.insts2025.02.03 15:40:29en
sync.item.modts2025.01.17 15:33:44en
thesis.grantorVysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií. Ústav fyzikycs
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