Surface morphology and X-ray photoelectron spectroscopy of BiFeO3 thin films deposited on top of Ta2O5/Si layers
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Date
2021-07-26
Authors
Ramazanov, Shikhgasan
Ţălu, Ştefan
Dallaev, Rashid
Ramazanov, Gusejn
Škarvada, Pavel
Oulehla, Jindřich
Sobola, Dinara
Nazarov, Dmitry
0000-0002-6823-5725Advisor
Referee
Mark
Journal Title
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Volume Title
Publisher
EDP Sciences
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Abstract
In this study a comparison of the topography of BiFeO3 (BFO) thin films deposited on tantalum pentoxide substrates of different thicknesses is provided. The Ta2O5 substrates had a roughness increasing with the film thickness. The relationship between substrates of different topography but the same composition with the quality of the growing bismuth ferrite film is estimated. For the first time the topography estimation of BFO on Ta2O5 is presented. The difference in temperature expansion coefficients leads to intensive evaporation of bismuth ferrite from the surface during annealing. XPS analysis is provided for asdeposited and annealed BFO layers.
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Citation
E3S Web of Conferences. 2021, vol. 295, issue 1, p. 1-7.
https://www.e3s-conferences.org/articles/e3sconf/abs/2021/71/e3sconf_wfsdi2021_04009/e3sconf_wfsdi2021_04009.html
https://www.e3s-conferences.org/articles/e3sconf/abs/2021/71/e3sconf_wfsdi2021_04009/e3sconf_wfsdi2021_04009.html
Document type
Peer-reviewed
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Published version
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Language of document
en