Advanced Structural Analysis Of Silicon Solar Cells

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but.event.date25.04.2019cs
but.event.titleStudent EEICT 2019cs
dc.contributor.authorPapež, Nikola
dc.date.accessioned2020-04-16T07:19:40Z
dc.date.available2020-04-16T07:19:40Z
dc.date.issued2019cs
dc.description.abstractThe study investigates the structural imperfections of photovoltaic cells based on polycrystalline silicon. Experimental characterization focuses in particular on the degradation and defects analysis. Two modern techniques were used – scanning electron microscopy (SEM) with electron beam induced current (EBIC) and 3D digital optical microscopy. The properties and range of cell defects that can significantly affect its function were characterized with this inspection and failure Analysis.en
dc.formattextcs
dc.format.extent723-727cs
dc.format.mimetypeapplication/pdfen
dc.identifier.citationProceedings of the 25st Conference STUDENT EEICT 2019. s. 723-727. ISBN 978-80-214-5735-5cs
dc.identifier.isbn978-80-214-5735-5
dc.identifier.urihttp://hdl.handle.net/11012/186767
dc.language.isoencs
dc.publisherVysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.relation.ispartofProceedings of the 25st Conference STUDENT EEICT 2019en
dc.relation.urihttp://www.feec.vutbr.cz/EEICT/cs
dc.rights© Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.rights.accessopenAccessen
dc.subjectSEMen
dc.subjectEBICen
dc.subjectoptical microscopyen
dc.subjectsolar cellsen
dc.subjectdefectsen
dc.titleAdvanced Structural Analysis Of Silicon Solar Cellsen
dc.type.driverconferenceObjecten
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
eprints.affiliatedInstitution.departmentFakulta elektrotechniky a komunikačních technologiícs
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