Advanced Structural Analysis Of Silicon Solar Cells
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Date
Authors
Papež, Nikola
Advisor
Referee
Mark
Journal Title
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Volume Title
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Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií
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Abstract
The study investigates the structural imperfections of photovoltaic cells based on polycrystalline silicon. Experimental characterization focuses in particular on the degradation and defects analysis. Two modern techniques were used – scanning electron microscopy (SEM) with electron beam induced current (EBIC) and 3D digital optical microscopy. The properties and range of cell defects that can significantly affect its function were characterized with this inspection and failure Analysis.
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Citation
Proceedings of the 25st Conference STUDENT EEICT 2019. s. 723-727. ISBN 978-80-214-5735-5
http://www.feec.vutbr.cz/EEICT/
http://www.feec.vutbr.cz/EEICT/
Document type
Peer-reviewed
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Published version
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Language of document
en