Physical properties investigation of reduced graphene oxide thin films prepared by material inkjet printing

Simple item page
dc.contributor.authorSchmiedová, Veronikacs
dc.contributor.authorPospíšil, Jancs
dc.contributor.authorKovalenko, Alexandercs
dc.contributor.authorČuboň, Tomášcs
dc.contributor.authorZmeškal, Oldřichcs
dc.contributor.authorWeiter, Martincs
dc.coverage.issue2017cs
dc.date.issued2017-08-23cs
dc.description.abstractThe article is focused on the study of the optical properties of inkjet-printed graphene oxide (GO) layers by spectroscopic ellipsometry. Due to its unique optical and electrical properties, GO can be used as, for example, a transparent and flexible electrode material in organic and printed electronics. Spectroscopic ellipsometry was used to characterize the optical response of the GO layer and its reduced form (rGO, obtainable, for example, by reduction of prepared layers by either annealing, UV radiation, or chemical reduction) in the visible range. The thicknesses of the layers were determined by a mechanical profilometer and used as an input parameter for optical modeling. Ellipsometric spectra were analyzed according to the dispersion model and the influence of the reduction of GO on optical constants is discussed. Thus, detailed analysis of the ellipsometric data provides a unique tool for qualitative and also quantitative description of the optical properties of GO thin films for electronic applications.en
dc.description.abstractThe article is focused on the study of the optical properties of inkjet-printed graphene oxide (GO) layers by spectroscopic ellipsometry. Due to its unique optical and electrical properties, GO can be used as, for example, a transparent and flexible electrode material in organic and printed electronics. Spectroscopic ellipsometry was used to characterize the optical response of the GO layer and its reduced form (rGO, obtainable, for example, by reduction of prepared layers by either annealing, UV radiation, or chemical reduction) in the visible range. The thicknesses of the layers were determined by a mechanical profilometer and used as an input parameter for optical modeling. Ellipsometric spectra were analyzed according to the dispersion model and the influence of the reduction of GO on optical constants is discussed. Thus, detailed analysis of the ellipsometric data provides a unique tool for qualitative and also quantitative description of the optical properties of GO thin films for electronic applications.en
dc.formattextcs
dc.format.extent1-8cs
dc.format.mimetypeapplication/pdfcs
dc.identifier.citationJournal of Nanomaterials. 2017, issue 2017, p. 1-8.en
dc.identifier.doi10.1155/2017/3501903cs
dc.identifier.issn1687-4129cs
dc.identifier.orcid0000-0002-0557-9862cs
dc.identifier.orcid0000-0002-2517-6227cs
dc.identifier.orcid0000-0001-7886-8588cs
dc.identifier.other138501cs
dc.identifier.researcheridLUZ-2359-2024cs
dc.identifier.urihttp://hdl.handle.net/11012/69896
dc.language.isoencs
dc.publisherHindawi Publishing Corporationcs
dc.relation.ispartofJournal of Nanomaterialscs
dc.relation.urihttp://dx.doi.org/10.1155/2017/3501903cs
dc.rightsCreative Commons Attribution 4.0 Internationalcs
dc.rights.accessopenAccesscs
dc.rights.sherpahttp://www.sherpa.ac.uk/romeo/issn/1687-4129/cs
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/cs
dc.subjectOrganic materialsen
dc.subjectspectroscopic ellipsometryen
dc.subjectsolar cellsen
dc.subjectUV-VIS absorptionen
dc.subjectprofilometryen
dc.subjectinkjet printingen
dc.subjectOrganic materials
dc.subjectspectroscopic ellipsometry
dc.subjectsolar cells
dc.subjectUV-VIS absorption
dc.subjectprofilometry
dc.subjectinkjet printing
dc.titlePhysical properties investigation of reduced graphene oxide thin films prepared by material inkjet printingen
dc.title.alternativePhysical properties investigation of reduced graphene oxide thin films prepared by material inkjet printingen
dc.type.driverarticleen
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
sync.item.dbidVAV-138501en
sync.item.dbtypeVAVen
sync.item.insts2025.10.14 14:06:34en
sync.item.modts2025.10.14 10:32:24en
thesis.grantorVysoké učení technické v Brně. Fakulta chemická. CMV - laboratoř organické elektroniky a fotonikycs
Files
Original bundle
Now showing 1 - 1 of 1
Thumbnail Image
Name:
3501903.pdf
Size:
3.88 MB
Format:
Adobe Portable Document Format
Description:
3501903.pdf
Download
Collections
CMV - laboratoř organické elektroniky a fotoniky