Physical properties investigation of reduced graphene oxide thin films prepared by material inkjet printing

The article is focused on the study of the optical properties of inkjet-printed graphene oxide (GO) layers by spectroscopic ellipsometry. Due to its unique optical and electrical properties, GO can be used as, for example, a transparent and flexible electrode material in organic and printed electronics. Spectroscopic ellipsometry was used to characterize the optical response of the GO layer and its reduced form (rGO, obtainable, for example, by reduction of prepared layers by either annealing, UV radiation, or chemical reduction) in the visible range. The thicknesses of the layers were determined by a mechanical profilometer and used as an input parameter for optical modeling. Ellipsometric spectra were analyzed according to the dispersion model and the influence of the reduction of GO on optical constants is discussed. Thus, detailed analysis of the ellipsometric data provides a unique tool for qualitative and also quantitative description of the optical properties of GO thin films for electronic applications.
Článek je zaměřen na studium optických vlastností, zejména pomocí spektroskopické elipsometrie, vrstev grafen oxidu (GO) připravených materiálovým tiskem. Díky svým jedinečným optickým a elektrickým vlastnostem je GO možné použít například jako transparentní a pružný materiál pro elektrodu v organické a tištěné elektronice.

Keywords

Organické materiály, spektroskopická elipsometrie, solární články, UV-VIS absorpce, profilometrie, materiálová tiskárna, Organic materials, spectroscopic ellipsometry, solar cells, UV-VIS absorption, profilometry, inkjet printing

Citation

Journal of Nanomaterials. 2017, issue 2017, p. 1-8.
http://dx.doi.org/10.1155/2017/3501903

Document type

Peer-reviewed

Document version

Published version

Language of document

en

Document licence

Creative Commons Attribution 4.0 International
http://creativecommons.org/licenses/by/4.0/