Sample Holders for Sub-THz Electron Spin Resonance Spectroscopy
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Sojka, Antonín
Šedivý, Matúš
Lagiň, Adam
Gabriš, Andrej
Láznička, Tomáš
Santana, Vinicius Tadeu
Laguta, Oleksii
Neugebauer, Petr
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Mark
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IEEE
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Abstract
Electron spin resonance (ESR) is a powerful spectroscopic technique used to investigate samples with unpaired electrons in a broad range of scientific fields. High-frequency ESR (HF-ESR) spectrometers operating at sub-THz frequencies are mostly custom-made with non-standard solutions. This article presents a set of six different exchangeable sample holders with a fast-loading flange for a sub-THz ESR spectrometer operating at high magnetic fields up to 16 T and temperature ranges of 4-400 K. Here, we report on the concept, design, and illustrative measurements of non-resonant ESR sample holders for the measurements of samples in a liquid solution, polycrystalline-compressed powders, oriented single crystals, electrical devices under sub-THz irradiation, as well as for samples transferred from the ultrahigh vacuum (UHV) systems without air contamination. Our solution expands the usage possibilities for HF-ESR spectroscopy, showing that one spectrometer with the presented concept of sample holders enables a wide range of applications.
Electron spin resonance (ESR) is a powerful spectroscopic technique used to investigate samples with unpaired electrons in a broad range of scientific fields. High-frequency ESR (HF-ESR) spectrometers operating at sub-THz frequencies are mostly custom-made with non-standard solutions. This article presents a set of six different exchangeable sample holders with a fast-loading flange for a sub-THz ESR spectrometer operating at high magnetic fields up to 16 T and temperature ranges of 4-400 K. Here, we report on the concept, design, and illustrative measurements of non-resonant ESR sample holders for the measurements of samples in a liquid solution, polycrystalline-compressed powders, oriented single crystals, electrical devices under sub-THz irradiation, as well as for samples transferred from the ultrahigh vacuum (UHV) systems without air contamination. Our solution expands the usage possibilities for HF-ESR spectroscopy, showing that one spectrometer with the presented concept of sample holders enables a wide range of applications.
Electron spin resonance (ESR) is a powerful spectroscopic technique used to investigate samples with unpaired electrons in a broad range of scientific fields. High-frequency ESR (HF-ESR) spectrometers operating at sub-THz frequencies are mostly custom-made with non-standard solutions. This article presents a set of six different exchangeable sample holders with a fast-loading flange for a sub-THz ESR spectrometer operating at high magnetic fields up to 16 T and temperature ranges of 4-400 K. Here, we report on the concept, design, and illustrative measurements of non-resonant ESR sample holders for the measurements of samples in a liquid solution, polycrystalline-compressed powders, oriented single crystals, electrical devices under sub-THz irradiation, as well as for samples transferred from the ultrahigh vacuum (UHV) systems without air contamination. Our solution expands the usage possibilities for HF-ESR spectroscopy, showing that one spectrometer with the presented concept of sample holders enables a wide range of applications.
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Optical waveguides , Connectors , Pollution measurement , Magnetic resonance , Temperature measurement , Probes , Magnetic field measurement , Frequency-domain magnetic resonance (FDMR) , high-field , high-frequency electron spin resonance (ESR) , EPR , high-frequency (HF) EPR , liquids , rapid scan (RS) ESR , single-crystal , ultrahigh vacuum (UHV) , Optical waveguides , Connectors , Pollution measurement , Magnetic resonance , Temperature measurement , Probes , Magnetic field measurement , Frequency-domain magnetic resonance (FDMR) , high-field , high-frequency electron spin resonance (ESR) , EPR , high-frequency (HF) EPR , liquids , rapid scan (RS) ESR , single-crystal , ultrahigh vacuum (UHV)
Citation
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. 2022, vol. 71, issue 1, p. 1-12.
https://ieeexplore.ieee.org/document/9745915
https://ieeexplore.ieee.org/document/9745915
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en
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Except where otherwised noted, this item's license is described as Creative Commons Attribution 4.0 International

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