Application of Dual-target Computed Tomography for Material Decomposition of Low-Z Materials

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dc.contributor.authorMikuláček, Pavelcs
dc.contributor.authorZemek, Marekcs
dc.contributor.authorŠtarha, Pavelcs
dc.contributor.authorZikmund, Tomášcs
dc.contributor.authorKaiser, Jozefcs
dc.coverage.issue2cs
dc.coverage.volume43cs
dc.date.accessioned2024-07-23T10:46:11Z
dc.date.available2024-07-23T10:46:11Z
dc.date.issued2024-06-01cs
dc.description.abstractThe extension of conventional computed tomography known as spectral computed tomography involves utilizing the variations in X-ray attenuation, driven by spectral and material dependencies. This technique enables the virtual decomposition of scanned objects, revealing their elemental constituents. The resultant images provide quantitative information, such as material concentration within the scanned volume. Enhancements in results are achievable through methods that capitalize on the strong correlation among decomposed images, effectively minimizing noise and artifacts. The Rigaku nano3DX submicron tomograph uses a dual-target source, which allows the generation of two distinct X-ray spectra through different target materials. This configuration holds promise for high-resolution applications in spectral tomography, particularly for low-Z materials, where it offers high contrast in the acquired images. The potential of this setup in the context of spectral computed tomography is explored in this contribution, delving into its applications for materials characterized by low atomic numbers.en
dc.formattextcs
dc.format.extent10cs
dc.format.mimetypeapplication/pdfcs
dc.identifier.citationJOURNAL OF NONDESTRUCTIVE EVALUATION. 2024, vol. 43, issue 2, 10 p.en
dc.identifier.doi10.1007/s10921-024-01070-zcs
dc.identifier.issn0195-9298cs
dc.identifier.orcid0009-0006-3870-1656cs
dc.identifier.orcid0000-0002-3236-4111cs
dc.identifier.orcid0000-0001-8150-913Xcs
dc.identifier.orcid0000-0003-2948-5198cs
dc.identifier.orcid0000-0002-7397-125Xcs
dc.identifier.other188609cs
dc.identifier.researcheridJTU-0936-2023cs
dc.identifier.researcheridAAT-5323-2021cs
dc.identifier.researcheridAAE-8423-2019cs
dc.identifier.researcheridG-9491-2014cs
dc.identifier.researcheridD-6800-2012cs
dc.identifier.scopus57221376039cs
dc.identifier.scopus56579326200cs
dc.identifier.scopus7402184758cs
dc.identifier.urihttps://hdl.handle.net/11012/249349
dc.language.isoencs
dc.publisherSPRINGER/PLENUM PUBLISHERScs
dc.relation.ispartofJOURNAL OF NONDESTRUCTIVE EVALUATIONcs
dc.relation.urihttps://link.springer.com/article/10.1007/s10921-024-01070-zcs
dc.rightsCreative Commons Attribution 4.0 Internationalcs
dc.rights.accessopenAccesscs
dc.rights.sherpahttp://www.sherpa.ac.uk/romeo/issn/0195-9298/cs
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/cs
dc.subjectComputed tomographyen
dc.subjectSpectral CTen
dc.subjectDual-targeten
dc.subjectMaterial decompositionen
dc.subjectLow-Z materialsen
dc.subjectCorrelated noiseen
dc.titleApplication of Dual-target Computed Tomography for Material Decomposition of Low-Z Materialsen
dc.type.driverarticleen
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
sync.item.dbidVAV-188609en
sync.item.dbtypeVAVen
sync.item.insts2024.07.23 12:46:11en
sync.item.modts2024.07.23 12:13:40en
thesis.grantorVysoké učení technické v Brně. Středoevropský technologický institut VUT. Pokročilé instrumentace a metody pro charakterizace materiálůcs
thesis.grantorVysoké učení technické v Brně. Fakulta strojního inženýrství. Ústav matematikycs
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Ústav matematiky
Pokročilé instrumentace a metody pro charakterizace materiálů