SEM imaging and XPS characterization of doped PVDF fibers
| dc.contributor.author | Smejkalová, Tereza | cs |
| dc.contributor.author | Ţălu, Ştefan | cs |
| dc.contributor.author | Dallaev, Rashid | cs |
| dc.contributor.author | Částková, Klára | cs |
| dc.contributor.author | Sobola, Dinara | cs |
| dc.contributor.author | Nazarov, Anton | cs |
| dc.coverage.issue | 1 | cs |
| dc.coverage.volume | 270 | cs |
| dc.date.accessioned | 2021-08-13T06:53:03Z | |
| dc.date.available | 2021-08-13T06:53:03Z | |
| dc.date.issued | 2021-06-10 | cs |
| dc.description.abstract | Polyvinylidene fluoride (PVDF) is one of the most promising electroactive polymers; it exhibits excellent electroactive behaviours, good biocompatibility, excellent chemical resistance, and thermal stability, rendering it an attractive material for biomedical, electronic, environmental and energy harvesting applications. This work aims to further improve its properties by the inclusion of powders of piezoactive materials. Polyvinylidene fluoride was formed by electrospinning into fibres with a thickness of 1.5-0.3 µm and then examined in a scanning electron microscope. The work offers a description of the current procedure in the preparation of samples and their modification for examination in a scanning electron microscope, characterizes the individual components of doped fibres and deals with specific instruments used for various analytical methods. The work contains a theoretical introduction to the analytical methods to which the samples will be further subjected, such as energy dispersive X-ray spectroscopy (EDX), X-ray photoelectron spectroscopy (XPS). The obtained excellent properties of doped PVDF could be used in the design of sensors | en |
| dc.format | text | cs |
| dc.format.extent | 1-14 | cs |
| dc.format.mimetype | application/pdf | cs |
| dc.identifier.citation | E3S Web of Conferences. 2021, vol. 270, issue 1, p. 1-14. | en |
| dc.identifier.doi | 10.1051/e3sconf/202127001011 | cs |
| dc.identifier.issn | 2267-1242 | cs |
| dc.identifier.other | 171780 | cs |
| dc.identifier.uri | http://hdl.handle.net/11012/200969 | |
| dc.language.iso | en | cs |
| dc.publisher | EDP Sciences | cs |
| dc.relation.ispartof | E3S Web of Conferences | cs |
| dc.relation.uri | https://www.e3s-conferences.org/articles/e3sconf/abs/2021/46/e3sconf_wfces2021_01011/e3sconf_wfces2021_01011.html | cs |
| dc.rights | Creative Commons Attribution 4.0 International | cs |
| dc.rights.access | openAccess | cs |
| dc.rights.sherpa | http://www.sherpa.ac.uk/romeo/issn/2267-1242/ | cs |
| dc.rights.uri | http://creativecommons.org/licenses/by/4.0/ | cs |
| dc.subject | PVDF | en |
| dc.subject | SEM | en |
| dc.subject | XPS | en |
| dc.title | SEM imaging and XPS characterization of doped PVDF fibers | en |
| dc.type.driver | conferenceObject | en |
| dc.type.status | Peer-reviewed | en |
| dc.type.version | publishedVersion | en |
| sync.item.dbid | VAV-171780 | en |
| sync.item.dbtype | VAV | en |
| sync.item.insts | 2021.08.13 08:53:03 | en |
| sync.item.modts | 2021.08.13 08:14:31 | en |
| thesis.grantor | Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií. Ústav fyziky | cs |
| thesis.grantor | Vysoké učení technické v Brně. Fakulta strojního inženýrství. Fakulta strojního inženýrství | cs |
Files
Original bundle
1 - 1 of 1
Loading...
- Name:
- e3sconf_wfces2021_01011.pdf
- Size:
- 1.18 MB
- Format:
- Adobe Portable Document Format
- Description:
- e3sconf_wfces2021_01011.pdf