Characterization of the native oxide on CdTe surfaces

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dc.contributor.authorSobola, Dinaracs
dc.contributor.authorKaspar, Pavelcs
dc.contributor.authorNebojsa, Aloiscs
dc.contributor.authorHemzal, Dušancs
dc.contributor.authorGrmela, Lubomírcs
dc.contributor.authorSmith, Steve J.cs
dc.coverage.issue2cs
dc.coverage.volume37cs
dc.date.accessioned2021-07-23T14:55:20Z
dc.date.available2021-07-23T14:55:20Z
dc.date.issued2019-05-29cs
dc.description.abstractThis study focuses on the description of oxidation of CdTe monocrystal surfaces after selective chemical etching. Measurements of surface morphology of the oxides occurring in short time are valuable for deeper understanding of the material degradation and fabrication of reliable devices with enhanced performance. The samples with (1 1 1) orientation were selectively etched and cleaned of oxide. Exposure of the oxide-free surfaces of CdTe to air at normal atmospheric conditions over 24 hours leads to an appearance of characteristic surface features. The oxidized surfaces were investigated by scanning electron microscopy, scanning probe microscopy, Raman spectroscopy and ellipsometry. The results indicate clear differences in the oxidation of Cd-terminated and Te-terminated surfaces.en
dc.description.abstractTato studie je zaměřena na popis oxidace monokrystalického povrchů CdTe po selektivním chemickým leptání.cs
dc.formattextcs
dc.format.extent206-211cs
dc.format.mimetypeapplication/pdfcs
dc.identifier.citationMATERIALS SCIENCE-POLAND. 2019, vol. 37, issue 2, p. 206-211.en
dc.identifier.doi10.2478/msp-2019-0030cs
dc.identifier.issn2083-134Xcs
dc.identifier.other157133cs
dc.identifier.urihttp://hdl.handle.net/11012/200897
dc.language.isoencs
dc.publisherSciendocs
dc.relation.ispartofMATERIALS SCIENCE-POLANDcs
dc.relation.urihttps://content.sciendo.com/view/journals/msp/ahead-of-print/article-10.2478-msp-2019-0030.xmlcs
dc.rightsCreative Commons Attribution-NonCommercial-NoDerivatives 4.0 Internationalcs
dc.rights.accessopenAccesscs
dc.rights.sherpahttp://www.sherpa.ac.uk/romeo/issn/2083-134X/cs
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/cs
dc.subjectselective etchingen
dc.subjectscanning probe microscopyen
dc.subjectellipsometryen
dc.subjectRaman spectroscopyen
dc.subjectselektivní leptání
dc.subjectSPM
dc.subjectelipsometrie
dc.subjectRamanova spektroskopie
dc.titleCharacterization of the native oxide on CdTe surfacesen
dc.title.alternativeCharakterizace nativního oxidu na povrchu CdTecs
dc.type.driverarticleen
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
sync.item.dbidVAV-157133en
sync.item.dbtypeVAVen
sync.item.insts2021.07.23 16:55:20en
sync.item.modts2021.07.23 16:14:09en
thesis.grantorVysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií. oddělení-FYZ-SIXcs
thesis.grantorVysoké učení technické v Brně. Středoevropský technologický institut VUT. Pokročilé instrumentace a metody pro charakterizace materiálůcs
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