On The Efficiency Of Precise Fault Localization And Identification In No

Valachovič, Marek

On The Efficiency Of Precise Fault Localization And Identification In No

but.event.date	23.04.2020	cs
but.event.title	Student EEICT 2020	cs
dc.contributor.author	Valachovič, Marek
dc.date.accessioned	2021-07-15T11:17:19Z
dc.date.available	2021-07-15T11:17:19Z
dc.date.issued	2020	cs
dc.description.abstract	The paper joins the Bonfire NoC model, desrcibed in VHDL, together with a method of the precise localization and identification of faults in NoC and sums up a few findings about the efficiency of fault-tolerant NoC employing the method. A special focus is given to the area overhead and the mean time between failures in the presence of no or one permanent fault and some transient faults.	en
dc.format	text	cs
dc.format.extent	112-115	cs
dc.format.mimetype	application/pdf	en
dc.identifier.citation	Proceedings I of the 26st Conference STUDENT EEICT 2020: General papers. s. 112-115. ISBN 978-80-214-5867-3	cs
dc.identifier.isbn	978-80-214-5867-3
dc.identifier.uri	http://hdl.handle.net/11012/200534
dc.language.iso	cs	cs
dc.publisher	Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií	cs
dc.relation.ispartof	Proceedings I of the 26st Conference STUDENT EEICT 2020: General papers	en
dc.relation.uri	https://conf.feec.vutbr.cz/eeict/EEICT2020	cs
dc.rights	© Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií	cs
dc.rights.access	openAccess	en
dc.subject	Network on chip	en
dc.subject	NoC	en
dc.subject	network switch	en
dc.subject	router	en
dc.subject	flow control	en
dc.subject	performance	en
dc.subject	fault tolerance	en
dc.subject	FPGA	en
dc.subject	VLSI	en
dc.title	On The Efficiency Of Precise Fault Localization And Identification In No	en
dc.type.driver	conferenceObject	en
dc.type.status	Peer-reviewed	en
dc.type.version	publishedVersion	en
eprints.affiliatedInstitution.department	Fakulta elektrotechniky a komunikačních technologií	cs

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