Spectrum Analysis Of Damaged Led Light Sources

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but.event.date25.04.2019cs
but.event.titleStudent EEICT 2019cs
dc.contributor.authorJaník, Daniel
dc.date.accessioned2020-04-16T07:19:40Z
dc.date.available2020-04-16T07:19:40Z
dc.date.issued2019cs
dc.description.abstractPermanent damage to LED chips, often high temperature is one of the common problems. The article compares the spectrum of LED retrofits before and after permanent high temperature damage. Several different samples tested were damaged by the same defined temperature during operation. The radiated spectrum was measured before and after exposure to the temperature and subsequently evaluated.en
dc.formattextcs
dc.format.extent699-702cs
dc.format.mimetypeapplication/pdfen
dc.identifier.citationProceedings of the 25st Conference STUDENT EEICT 2019. s. 699-702. ISBN 978-80-214-5735-5cs
dc.identifier.isbn978-80-214-5735-5
dc.identifier.urihttp://hdl.handle.net/11012/186762
dc.language.isoencs
dc.publisherVysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.relation.ispartofProceedings of the 25st Conference STUDENT EEICT 2019en
dc.relation.urihttp://www.feec.vutbr.cz/EEICT/cs
dc.rights© Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.rights.accessopenAccessen
dc.subjectLED light sourcesen
dc.subjectLED retrofiten
dc.subjectpermanent damageen
dc.titleSpectrum Analysis Of Damaged Led Light Sourcesen
dc.type.driverconferenceObjecten
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
eprints.affiliatedInstitution.departmentFakulta elektrotechniky a komunikačních technologiícs
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