Spectrum Analysis Of Damaged Led Light Sources
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Date
Authors
Janík, Daniel
Advisor
Referee
Mark
Journal Title
Journal ISSN
Volume Title
Publisher
Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií
ORCID
Abstract
Permanent damage to LED chips, often high temperature is one of the common problems. The article compares the spectrum of LED retrofits before and after permanent high temperature damage. Several different samples tested were damaged by the same defined temperature during operation. The radiated spectrum was measured before and after exposure to the temperature and subsequently evaluated.
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Citation
Proceedings of the 25st Conference STUDENT EEICT 2019. s. 699-702. ISBN 978-80-214-5735-5
http://www.feec.vutbr.cz/EEICT/
http://www.feec.vutbr.cz/EEICT/
Document type
Peer-reviewed
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Published version
Date of access to the full text
Language of document
en