Complete Ring Artifacts Reduction Procedure for Lab-Based X-ray Nano CT Systems

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dc.contributor.authorŠalplachta, Jakubcs
dc.contributor.authorZikmund, Tomášcs
dc.contributor.authorZemek, Marekcs
dc.contributor.authorBřínek, Adamcs
dc.contributor.authorTakeda, Yoshihirocs
dc.contributor.authorOmote, Kazuhikocs
dc.contributor.authorKaiser, Jozefcs
dc.coverage.issue1cs
dc.coverage.volume21cs
dc.date.accessioned2021-01-27T19:58:25Z
dc.date.available2021-01-27T19:58:25Z
dc.date.issued2021-01-01cs
dc.description.abstractIn this article, we introduce a new ring artifacts reduction procedure that combines several ideas from existing methods into one complex and robust approach with a goal to overcome their individual weaknesses and limitations. The procedure differentiates two types of ring artifacts according to their cause and character in computed tomography (CT) data. Each type is then addressed separately in the sinogram domain. The novel iterative schemes based on relative total variations (RTV) were integrated to detect the artifacts. The correction process uses the image inpainting, and the intensity deviations smoothing method. The procedure was implemented in scope of lab-based X-ray nano CT with detection systems based on charge-coupled device (CCD) and scientific complementary metal-oxide-semiconductor (sCMOS) technologies. The procedure was then further tested and optimized on the simulated data and the real CT data of selected samples with different compositions. The performance of the procedure was quantitatively evaluated in terms of the artifacts' detection accuracy, the comparison with existing methods, and the ability to preserve spatial resolution. The results show a high efficiency of ring removal and the preservation of the original sample's structure.en
dc.formattextcs
dc.format.extent1-20cs
dc.format.mimetypeapplication/pdfcs
dc.identifier.citationSENSORS. 2021, vol. 21, issue 1, p. 1-20.en
dc.identifier.doi10.3390/s21010238cs
dc.identifier.issn1424-8220cs
dc.identifier.other168313cs
dc.identifier.urihttp://hdl.handle.net/11012/195921
dc.language.isoencs
dc.publisherMDPIcs
dc.relation.ispartofSENSORScs
dc.relation.urihttps://www.mdpi.com/1424-8220/21/1/238cs
dc.rightsCreative Commons Attribution 4.0 Internationalcs
dc.rights.accessopenAccesscs
dc.rights.sherpahttp://www.sherpa.ac.uk/romeo/issn/1424-8220/cs
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/cs
dc.subjectring artifacts reductionen
dc.subjectCCD detectoren
dc.subjectsCMOS detectoren
dc.subjecthigh-resolution X-ray computed tomographyen
dc.subjectrelative total variationen
dc.titleComplete Ring Artifacts Reduction Procedure for Lab-Based X-ray Nano CT Systemsen
dc.type.driverarticleen
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
sync.item.dbidVAV-168313en
sync.item.dbtypeVAVen
sync.item.insts2021.01.27 20:58:24en
sync.item.modts2021.01.27 20:15:26en
thesis.grantorVysoké učení technické v Brně. Středoevropský technologický institut VUT. Charakterizace materiálů a pokročilé povlaky 1-06cs
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