Saving area and power consumption in 65 nm digital standard cell library

but.event.date26.04.2022cs
but.event.titleSTUDENT EEICT 2022cs
dc.contributor.authorKrál, Vojtěch
dc.date.accessioned2023-04-25T10:17:07Z
dc.date.available2023-04-25T10:17:07Z
dc.date.issued2022cs
dc.description.abstractThis study aims to investigate multi-bit pulsed latches in comparison with multi-bit flip flops as one of the low-power solutions in 65 nm technology process. Topologies of pulse generators and multi-bit pulsed latches were investigated to find out which can be more suitable. The pulse generator was chosen because of its low power and a small area in comparison with other options. The pulse generator is made of a simple AND logical gate and a double-stacked inverter. The pulsed latch was also chosen because of its low power, small area, and reliability of the circuit. The chosen topology is modified PPCLA. Simulations of the chosen topology had shown that multi-bit flip flops could be replaced with more effective multi-bit pulsed latches.en
dc.formattextcs
dc.format.extent190-193cs
dc.format.mimetypeapplication/pdfen
dc.identifier.citationProceedings I of the 28st Conference STUDENT EEICT 2022: General papers. s. 190-193. ISBN 978-80-214-6029-4cs
dc.identifier.isbn978-80-214-6029-4
dc.identifier.urihttp://hdl.handle.net/11012/209324
dc.language.isoencs
dc.publisherVysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.relation.ispartofProceedings I of the 28st Conference STUDENT EEICT 2022: General papersen
dc.relation.urihttps://conf.feec.vutbr.cz/eeict/index/pages/view/ke_stazenics
dc.rights© Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.rights.accessopenAccessen
dc.subjectdigital standard libraryen
dc.subjectintegrated circuitsen
dc.subjectchip developmenten
dc.subjectlow power methodsen
dc.subjectpulse generatoren
dc.subjectmulti-bit pulsed latchen
dc.titleSaving area and power consumption in 65 nm digital standard cell libraryen
dc.type.driverconferenceObjecten
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
eprints.affiliatedInstitution.departmentFakulta elektrotechniky a komunikačních technologiícs
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