Modelling and Measuring Dielectric Constants for Very Thin Materials Using a Coaxial Probe

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dc.contributor.authorYou, K. Y.
dc.contributor.authorAbbas, Z.
dc.contributor.authorLee, C. Y.
dc.contributor.authorMalek, M. F. A.
dc.contributor.authorLee, K. Y.
dc.contributor.authorCheng, E. M.
dc.coverage.issue4cs
dc.coverage.volume23cs
dc.date.accessioned2014-12-16T09:32:55Z
dc.date.available2014-12-16T09:32:55Z
dc.date.issued2014-12cs
dc.description.abstractThis paper is focused on the non-destructive measurement of the dielectric constants (relative permittivities) of thin dielectric material (0.1 mm – 0.5 mm) using an open-ended coaxial probe with an outer diameter of 4.1 mm. Normalized de-embedding and network error calibration procedures were applied to the coaxial probe. The measured reflection coefficients for the thin samples were taken with a vector network analyzer up to 7 GHz, and the calibrated reflection coefficients were converted to relative dielectric constant using an empirical reflection-coefficient model. The empirical model was created using the regression method and expressed as a polynomial model, and the coefficients of model were obtained by fitting with the data using the Finite Element Method (FEM).en
dc.formattextcs
dc.format.extent1016-1025cs
dc.format.mimetypeapplication/pdfen
dc.identifier.citationRadioengineering. 2014, vol. 23, č. 4, s. 1016-1025. ISSN 1210-2512cs
dc.identifier.issn1210-2512
dc.identifier.urihttp://hdl.handle.net/11012/36557
dc.language.isoencs
dc.publisherSpolečnost pro radioelektronické inženýrstvícs
dc.relation.ispartofRadioengineeringcs
dc.relation.urihttp://www.radioeng.cz/fulltexts/2014/14_04_1016_1025.pdfcs
dc.rightsCreative Commons Attribution 3.0 Unported Licenseen
dc.rights.accessopenAccessen
dc.rights.urihttp://creativecommons.org/licenses/by/3.0/en
dc.subjectRelative effective permittivityen
dc.subjectone-port calibrationen
dc.subjectmeasured reflection coefficienten
dc.subjectopen-ended coaxial probeen
dc.subjectthin dielectric substrateen
dc.titleModelling and Measuring Dielectric Constants for Very Thin Materials Using a Coaxial Probeen
dc.type.driverarticleen
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
eprints.affiliatedInstitution.facultyFakulta eletrotechniky a komunikačních technologiícs
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