Noise Figure Measurement of Highly Mismatched DUT

Abstract

A device mismatch seriously degrades the accuracy of its noise figure characterization. A new second stage correction technique for highly mismatched device under test is proposed and compared to the standard technique. The presented method is based on additional vector measurement. It takes into account measuring receiver noise figure dependence on the DUT output mismatch besides an available gain correction. Significant accuracy improvement of measured data and decreased error variation is demonstrated. The suggested method is in principle able to eliminate all systematic errors in noise figure measurement.