Nanoelectronic COupled problems solutions - nanoCOPS: modelling, multirate, model order reduction, uncertainty quantification, fast fault simulation
dc.contributor.author | ter Maten, E Jan W | cs |
dc.contributor.author | Putek, Piotr | cs |
dc.contributor.author | Gunther, Michael | cs |
dc.contributor.author | Pulch, Roland | cs |
dc.contributor.author | Tischendorf, Caren | cs |
dc.contributor.author | Strohm, Christian | cs |
dc.contributor.author | Schoenmaker, Wim | cs |
dc.contributor.author | Meuris, Peter | cs |
dc.contributor.author | De Smedt, Bart | cs |
dc.contributor.author | Benner, Peter | cs |
dc.contributor.author | Feng, Lihong | cs |
dc.contributor.author | Banagaaya, Nicodemus | cs |
dc.contributor.author | Yue, Yao | cs |
dc.contributor.author | Janssen, Rick | cs |
dc.contributor.author | J Dohmen, Jos | cs |
dc.contributor.author | Tasić, Bratislav | cs |
dc.contributor.author | Deleu, Frederik | cs |
dc.contributor.author | Gillon, Renaud | cs |
dc.contributor.author | Wieers, Aarnout | cs |
dc.contributor.author | Brachtendorf, Hans-Georg | cs |
dc.contributor.author | Bittner, Kai | cs |
dc.contributor.author | Kratochvíl, Tomáš | cs |
dc.contributor.author | Petržela, Jiří | cs |
dc.contributor.author | Šotner, Roman | cs |
dc.contributor.author | Götthans, Tomáš | cs |
dc.contributor.author | Dřínovský, Jiří | cs |
dc.contributor.author | Schöps, Sebastian | cs |
dc.contributor.author | J Duque Guerra, David | cs |
dc.contributor.author | Casper, Thorben | cs |
dc.contributor.author | De Gersem, Herbert | cs |
dc.contributor.author | Römer, Ulrich | cs |
dc.contributor.author | Reynier, Pascal | cs |
dc.contributor.author | Barroul, Patrice | cs |
dc.contributor.author | Masliah, Denis | cs |
dc.contributor.author | Rousseau, Benoît | cs |
dc.coverage.issue | 2 | cs |
dc.coverage.volume | 7 | cs |
dc.date.issued | 2016-07-14 | cs |
dc.description.abstract | The FP7 project nanoCOPS derives new methods for simulation during development of designs of integrated products. It covers advanced simulation techniques for electromagnetics with feedback couplings to electronic circuits, heat and stress. It is inspired by interest from semiconductor industry and by a simulation tool vendor in electronic design automation. The project is on-going and the paper presents the outcomes achieved after the first half of the project duration. | en |
dc.format | text | cs |
dc.format.extent | 1-19 | cs |
dc.format.mimetype | application/pdf | cs |
dc.identifier.citation | Journal of Mathematics in Industry. 2016, vol. 7, issue 2, p. 1-19. | en |
dc.identifier.doi | 10.1186/s13362-016-0025-5 | cs |
dc.identifier.issn | 2190-5983 | cs |
dc.identifier.orcid | 0000-0001-8091-9233 | cs |
dc.identifier.orcid | 0000-0001-5286-9574 | cs |
dc.identifier.orcid | 0000-0002-2430-1815 | cs |
dc.identifier.orcid | 0000-0002-0386-1813 | cs |
dc.identifier.orcid | 0000-0002-2743-6926 | cs |
dc.identifier.other | 126770 | cs |
dc.identifier.researcherid | AAB-9821-2019 | cs |
dc.identifier.researcherid | DZG-2188-2022 | cs |
dc.identifier.researcherid | G-4209-2017 | cs |
dc.identifier.scopus | 21834355300 | cs |
dc.identifier.scopus | 9333762000 | cs |
dc.identifier.scopus | 21834721500 | cs |
dc.identifier.scopus | 41761598800 | cs |
dc.identifier.uri | http://hdl.handle.net/11012/65333 | |
dc.language.iso | en | cs |
dc.relation.ispartof | Journal of Mathematics in Industry | cs |
dc.relation.uri | http://mathematicsinindustry.springeropen.com/articles/10.1186/s13362-016-0025-5 | cs |
dc.rights | Creative Commons Attribution 4.0 International | cs |
dc.rights.access | openAccess | cs |
dc.rights.sherpa | http://www.sherpa.ac.uk/romeo/issn/2190-5983/ | cs |
dc.rights.uri | http://creativecommons.org/licenses/by/4.0/ | cs |
dc.subject | multirate | en |
dc.subject | model order reduction | en |
dc.subject | co-simulation | en |
dc.subject | uncertainty | en |
dc.subject | quantification | en |
dc.subject | power-MOS devices | en |
dc.subject | RF-circuitry | en |
dc.subject | bond wires | en |
dc.subject | coupled problems | en |
dc.subject | multiphysics | en |
dc.subject | fault simulation | en |
dc.title | Nanoelectronic COupled problems solutions - nanoCOPS: modelling, multirate, model order reduction, uncertainty quantification, fast fault simulation | en |
dc.type.driver | article | en |
dc.type.status | Peer-reviewed | en |
dc.type.version | publishedVersion | en |
sync.item.dbid | VAV-126770 | en |
sync.item.dbtype | VAV | en |
sync.item.insts | 2025.02.03 15:41:55 | en |
sync.item.modts | 2025.01.17 15:34:48 | en |
thesis.grantor | Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií. Ústav radioelektroniky | cs |
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