Nanoelectronic COupled problems solutions - nanoCOPS: modelling, multirate, model order reduction, uncertainty quantification, fast fault simulation

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dc.contributor.authorter Maten, E Jan Wcs
dc.contributor.authorPutek, Piotrcs
dc.contributor.authorGunther, Michaelcs
dc.contributor.authorPulch, Rolandcs
dc.contributor.authorTischendorf, Carencs
dc.contributor.authorStrohm, Christiancs
dc.contributor.authorSchoenmaker, Wimcs
dc.contributor.authorMeuris, Petercs
dc.contributor.authorDe Smedt, Bartcs
dc.contributor.authorBenner, Petercs
dc.contributor.authorFeng, Lihongcs
dc.contributor.authorBanagaaya, Nicodemuscs
dc.contributor.authorYue, Yaocs
dc.contributor.authorJanssen, Rickcs
dc.contributor.authorJ Dohmen, Joscs
dc.contributor.authorTasić, Bratislavcs
dc.contributor.authorDeleu, Frederikcs
dc.contributor.authorGillon, Renaudcs
dc.contributor.authorWieers, Aarnoutcs
dc.contributor.authorBrachtendorf, Hans-Georgcs
dc.contributor.authorBittner, Kaics
dc.contributor.authorKratochvíl, Tomášcs
dc.contributor.authorPetržela, Jiřícs
dc.contributor.authorŠotner, Romancs
dc.contributor.authorGötthans, Tomášcs
dc.contributor.authorDřínovský, Jiřícs
dc.contributor.authorSchöps, Sebastiancs
dc.contributor.authorJ Duque Guerra, Davidcs
dc.contributor.authorCasper, Thorbencs
dc.contributor.authorDe Gersem, Herbertcs
dc.contributor.authorRömer, Ulrichcs
dc.contributor.authorReynier, Pascalcs
dc.contributor.authorBarroul, Patricecs
dc.contributor.authorMasliah, Deniscs
dc.contributor.authorRousseau, Benoîtcs
dc.coverage.issue2cs
dc.coverage.volume7cs
dc.date.issued2016-07-14cs
dc.description.abstractThe FP7 project nanoCOPS derives new methods for simulation during development of designs of integrated products. It covers advanced simulation techniques for electromagnetics with feedback couplings to electronic circuits, heat and stress. It is inspired by interest from semiconductor industry and by a simulation tool vendor in electronic design automation. The project is on-going and the paper presents the outcomes achieved after the first half of the project duration.en
dc.formattextcs
dc.format.extent1-19cs
dc.format.mimetypeapplication/pdfcs
dc.identifier.citationJournal of Mathematics in Industry. 2016, vol. 7, issue 2, p. 1-19.en
dc.identifier.doi10.1186/s13362-016-0025-5cs
dc.identifier.issn2190-5983cs
dc.identifier.orcid0000-0001-8091-9233cs
dc.identifier.orcid0000-0001-5286-9574cs
dc.identifier.orcid0000-0002-2430-1815cs
dc.identifier.orcid0000-0002-0386-1813cs
dc.identifier.orcid0000-0002-2743-6926cs
dc.identifier.other126770cs
dc.identifier.researcheridAAB-9821-2019cs
dc.identifier.researcheridDZG-2188-2022cs
dc.identifier.researcheridG-4209-2017cs
dc.identifier.scopus21834355300cs
dc.identifier.scopus9333762000cs
dc.identifier.scopus21834721500cs
dc.identifier.scopus41761598800cs
dc.identifier.urihttp://hdl.handle.net/11012/65333
dc.language.isoencs
dc.relation.ispartofJournal of Mathematics in Industrycs
dc.relation.urihttp://mathematicsinindustry.springeropen.com/articles/10.1186/s13362-016-0025-5cs
dc.rightsCreative Commons Attribution 4.0 Internationalcs
dc.rights.accessopenAccesscs
dc.rights.sherpahttp://www.sherpa.ac.uk/romeo/issn/2190-5983/cs
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/cs
dc.subjectmultirateen
dc.subjectmodel order reductionen
dc.subjectco-simulationen
dc.subjectuncertaintyen
dc.subjectquantificationen
dc.subjectpower-MOS devicesen
dc.subjectRF-circuitryen
dc.subjectbond wiresen
dc.subjectcoupled problemsen
dc.subjectmultiphysicsen
dc.subjectfault simulationen
dc.titleNanoelectronic COupled problems solutions - nanoCOPS: modelling, multirate, model order reduction, uncertainty quantification, fast fault simulationen
dc.type.driverarticleen
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
sync.item.dbidVAV-126770en
sync.item.dbtypeVAVen
sync.item.insts2025.02.03 15:41:55en
sync.item.modts2025.01.17 15:34:48en
thesis.grantorVysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií. Ústav radioelektronikycs
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