Reduction Of Metal Artefacts In Ct Data With Submicron Resolution Using Dual-Target Ct
| but.event.date | 25.04.2019 | cs |
| but.event.title | Student EEICT 2019 | cs |
| dc.contributor.author | Víteček, Jakub | |
| dc.contributor.author | Šalplachta, Jiří | |
| dc.date.accessioned | 2020-04-16T07:19:35Z | |
| dc.date.available | 2020-04-16T07:19:35Z | |
| dc.date.issued | 2019 | cs |
| dc.description.abstract | The article deals with the possibility of the metal artefact reduction in computed tomography (CT) data with submicron resolution using dual-target CT. The sample is scanned twice at different acquisition parameters, at two different energy spectra. Dual-energy data are then used for easier localisation and segmentation of metal areas and the final combination of low and high-density materials. The final images are compared with the projection-based metal artefact reduction (MAR) algorithm and the commercial program VGStudio MAX 3.1. The results show good functionality of the proposed method and potential for further development. | en |
| dc.format | text | cs |
| dc.format.extent | 394-397 | cs |
| dc.format.mimetype | application/pdf | en |
| dc.identifier.citation | Proceedings of the 25st Conference STUDENT EEICT 2019. s. 394-397. ISBN 978-80-214-5735-5 | cs |
| dc.identifier.isbn | 978-80-214-5735-5 | |
| dc.identifier.uri | http://hdl.handle.net/11012/186701 | |
| dc.language.iso | en | cs |
| dc.publisher | Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií | cs |
| dc.relation.ispartof | Proceedings of the 25st Conference STUDENT EEICT 2019 | en |
| dc.relation.uri | http://www.feec.vutbr.cz/EEICT/ | cs |
| dc.rights | © Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií | cs |
| dc.rights.access | openAccess | en |
| dc.subject | X-ray computed tomography | en |
| dc.subject | Nanotomography | en |
| dc.subject | Submicron resolution | en |
| dc.subject | CT images artefacts | en |
| dc.subject | Reduction of metal artefacts | en |
| dc.subject | Dual-Target CT | en |
| dc.title | Reduction Of Metal Artefacts In Ct Data With Submicron Resolution Using Dual-Target Ct | en |
| dc.type.driver | conferenceObject | en |
| dc.type.status | Peer-reviewed | en |
| dc.type.version | publishedVersion | en |
| eprints.affiliatedInstitution.department | Fakulta elektrotechniky a komunikačních technologií | cs |
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